m27128af6 STMicroelectronics, m27128af6 Datasheet - Page 4

• Manufacturer Part Number: m27128af6
• Description: Nmos Eprom
• Manufacturer: STMicroelectronics

Figure 3. AC Testing Input Output Waveforms
Note that Output Hi-Z is defined as the point where data
is no longer driven.
M2716
AC MEASUREMENT CONDITIONS
Input Rise and Fall Times
Input Pulse Voltages
Input and Output Timing Ref. Voltages
Table 4. Capacitance
Note: 1. Sampled only, not 100% tested.
Table 5. Read Mode DC Characteristics
(T
Note: 1. V
4/9
Symbol
A
0.45V
I
V
V
= 0 to 70 C or –40 to 85 C; V
I
V
I
CC1
I
V
2.4V
I
Symbol
LO
CC
PP
LI
OH
OL
IH
IL
C
C
OUT
IN
CC
must be applied simultaneously with or before V
Input Leakage Current
Output Leakage Current
Supply Current
Supply Current (Standby)
Program Current
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Input Capacitance
Output Capacitance
Parameter
(1)
Parameter
(T
A
= 25 C, f = 1 MHz )
CC
0.45V to 2.4V
0.8V to 2.0V
= 5V
20ns
2.0V
0.8V
AI00827
(1)
5% or 5V
PP
V
OUT
and removed simultaneously or after V
EP = V
EP = V
Test Condition
Test Condition
0
I
OH
I
V
= V
OL
V
V
OUT
PP
IN
= –400 A
V
= 2.1mA
Figure 4. AC Testing Load Circuit
CC
IH
IN
IL
= 0V
= V
10%; V
= 0V
, G = V
, G = V
, EP = V
CC
C L includes JIG capacitance
V
DEVICE
UNDER
CC
TEST
IL
IL
PP
CC
= V
CC
)
Min
1.3V
–0.1
PP
Min
2.4
2
.
1N914
3.3k
C L = 100pF
Max
12
6
V
CC
Max
0.45
100
0.8
25
10
10
5
+ 1
OUT
AI00828
Unit
pF
pF
Unit
mA
mA
mA
V
V
V
V
A
A