k4x51163pc Samsung Semiconductor, Inc., k4x51163pc Datasheet - Page 10
k4x51163pc
Manufacturer Part Number
k4x51163pc
Description
32m X16 Mobile-ddr Sdram
Manufacturer
Samsung Semiconductor, Inc.
Datasheet
1.K4X51163PC.pdf
(23 pages)
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Absolute maximum ratings
Note :
Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded.
Functional operation should be restricted to recommend operation condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
K4X51163PC - L(F)E/G
DC Operating Conditions
Recommended operating conditions(Voltage referenced to VSS=0V, Tc = -25°C to 85°C)
Note :
1. Under all conditions, VDDQ must be less than or equal to VDD.
2. These parameters should be tested at the pin on actual components and may be checked at either the pin or the pad in simulation.
Supply voltage(for device with a nominal VDD of 1.8V)
I/O Supply voltage
Input logic high voltage
Input logic low voltage
Output logic high voltage
Output logic low voltage
Input leakage current
Output leakage current
Voltage on V
Voltage on V
Voltage on any pin relative to V
Storage temperature
Short circuit current
Power dissipation
DDQ
DD
Parameter
supply relative to V
Parameter
supply relative to V
SS
SS
SS
V
Symbol
IN
VOH(DC)
VOL(DC)
V
VIH(DC)
T
Symbol
VIL(DC)
V
, V
I
VDDQ
DDQ
P
STG
OS
VDD
DD
IOZ
D
II
OUT
0.7 x VDDQ
0.9 x VDDQ
Min
-0.3
1.7
1.7
-2
-5
-
-55 ~ +150
-0.5 ~ 2.7
-0.5 ~ 2.7
-0.5 ~ 2.7
Value
1.0
50
Mobile-DDR SDRAM
0.3 x VDDQ
0.1 x VDDQ
VDDQ+0.3
Max
1.95
1.95
2
5
-
Unit
uA
uA
V
V
V
V
V
V
February 2006
IOH = -0.1mA
IOL = 0.1mA
Unit
mA
°C
W
V
V
V
Note
1
1
2
2