SSC-KWT824 SEOUL [Seoul Semiconductor], SSC-KWT824 Datasheet - Page 11

• Manufacturer Part Number: SSC-KWT824
• Description: TOP LED DEVICE
• Manufacturer: SEOUL [Seoul Semiconductor]

※본 문서는 당사의 정보자산이므로, 불법 유출시 관계법과 회사규정에 의해 처벌됩니다. 205493/06.06.16 16:39/192.168.1.78
SSC-QP-0401-06(REV0.0)
12. RELIABILITY
(1) TEST ITEMS AND RESULTS
*
(2) CRITERIA FOR JUDGING THE DAMAGE
(3)ESD guarantee condition
High Temperature
1
Low Temperature
Luminous Intensity
Thermal Shock
Faulty decision of this test item is made by On / Off after the test.
Soldering Heat
High Humidity
Forward Voltage
Pulse Life Test
Reverse Current
Solderability
Heat Life Test
Resistance to
U.S.L. : Upper Standard Level
L.S.L. : Lower Standard Level
TEST ITEM
Steady State
Heat Load
Humidity
Storage
Life Test
Life Test
Item
HBM
Item
*1
*1
*1
*1
*1
-30℃ (30 min) ~ 85℃(30 min)
Symbol
T
a
V
I
I
Test Condition
R
V
T
T
F
= -30℃, I
a
a
On=2 sec,Off=2sec
148-29 Kasan-Dong, Keumchun-Gu, Seoul, Korea
T
= 85℃, RH = 85%,
Test conditions
I
I
1000 V
TEL: [phone] FAX: [phone]
= 60℃, RH = 90%
Transfer 5 min
I
sld
F
F
T
F
SEOUL SEMICONDUCTOR CO,. LTD.
T
T
sld
T
RH = 85%
= 10 mA/die
= 30 mA/die
a
a
a
= 20 mA/die
= 215±5℃,
10 sec.
5 sec.
= 100℃
= 260℃,
= 85℃,
= 25℃,
F
= 20 mA/die
I
I
Test Condition
F
F
V
- 11/11
R
Copyrightⓒ 2003 Seoul Semiconductor Co.,Ltd. All right reserved.
= 20 mA/die
= 20 mA/die
= 5 V/die
Criteria for Judgement
I
R
100,000 cycle
=100 ㎂ and below
Test Time
100 cycles
1000 hrs.
1000 hrs.
300 hrs
300 hrs
300 hrs
1 Time
1 Time
L.S.L×1.2
L.S.L×0.5
Criteria for Judgement
Min.
Number of
Damaged
-
0 /22
0 /22
0 /22
0 /22
0 /22
0 /22
0 /22
0 /22
0 /22
Test Form
CONTACT
Judgment
U.S.L×1.2
U.S.L×2.0
SSC-KWT824
Max.
OK.
OK.
OK.
OK.
OK.
OK.
OK.
OK.
OK.
-