NC7SZ00L6X Fairchild Semiconductor, NC7SZ00L6X Datasheet - Page 2

• Manufacturer Part Number: NC7SZ00L6X
• Description: IC GATE NAND UHS 2-INP 6MICROPAK
• Manufacturer: Fairchild Semiconductor
• Series: 7SZr

Specifications of NC7SZ00L6X

• Logic Type: NAND Gate
• Number Of Inputs: 2
• Number Of Circuits: 1
• Current - Output High, Low: 32mA, 32mA
• Voltage - Supply: 1.65 V ~ 5.5 V
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 6-MicroPak™
• Product: NAND
• Logic Family: NC7SV
• High Level Output Current: - 32 mA
• Low Level Output Current: 32 mA
• Propagation Delay Time: 5 ns
• Supply Voltage (max): 5.5 V
• Supply Voltage (min): 1.65 V
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• Minimum Operating Temperature: - 40 C
• Logical Function: NAND
• Number Of Elements: 1
• Operating Supply Voltage (typ): 1.8/2.5/3.3/5V
• Operating Temp Range: -40C to 85C
• Package Type: MicroPak W
• Number Of Outputs: 1
• Technology: CMOS
• Mounting: Surface Mount
• Pin Count: 6
• Operating Temperature Classification: Industrial
• Quiescent Current: 2uA
• Operating Supply Voltage (max): 5.5V
• Operating Supply Voltage (min): 1.65V
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

package assembled at Hana-Ayutthaya.
Change From
Change To
Results/Discussion for Qual Plan Number - Q20070331
Test: (Autoclave) | Conditions: 100%RH, 121C | Standard: JESD22-A102
Lot
Q20070331AAACLVB
Q20070331BAACLVB
Q20070331CAACLVB
Q20070331DAACLVB
Test: (C Scanning Acoustical Microscope) | Conditions: | Standard:
Lot
Q20070331AACSAM1B
Q20070331AACSAM2B
Q20070331BACSAM1B
Q20070331BACSAM2B
Q20070331CACSAM1B
Q20070331CACSAM2B
Q20070331DACSAM1B
Q20070331DACSAM2B
Test: (Construction Analysis) | Conditions: | Standard:
Lot
Q20070331AACONSTB
Q20070331BACONSTB
Q20070331CACONSTB
Q20070331DACONSTB
Test: (Flammability Certificate (3)) | Conditions: | Standard: UL94-0
Lot
Q20070331AAFLAMB
Q20070331BAFLAMB
Q20070331CAFLAMB
Q20070331DAFLAMB
Test: (High Temperature Storage Life) | Conditions: 150C | Standard: JESD22-A103
Lot
Q20070331AAHTSLB
Q20070331BAHTSLB
Q20070331CAHTSLB
Q20070331DAHTSLB
Test: (Highly Accelerated Stress Test) | Conditions: 85%RH, 110C, 0V | Standard: JESD22-A110
Lot
Q20070331AAHAST2B
Device
FSA2257L10X
NC7SZ125L6X
FHP3131IL6X
NC7SZ74L8X
Device
FSA2257L10X
NC7SZ125L6X
FHP3131IL6X
NC7SZ74L8X
Device
FSA2257L10X
NC7SZ125L6X
FHP3131IL6X
NC7SZ74L8X
Device
FSA2257L10X
NC7SZ125L6X
FHP3131IL6X
NC7SZ74L8X
Device
FSA2257L10X
NC7SZ125L6X
FHP3131IL6X
NC7SZ74L8X
Device
FSA2257L10X
Setpoint
96-HOURS
96-HOURS
96-HOURS
96-HOURS
Setpoint
Setpoint
Setpoint
Setpoint
168-HOURS
1000-HOURS
168-HOURS
1000-HOURS
168-HOURS
1000-HOURS
168-HOURS
1000-HOURS
Setpoint
264-HOURS
Result
0/77
0/77
0/77
0/77
Result
0/10
0/10
0/10
0/10
0/10
0/10
0/10
0/10
Result
0/10
0/10
0/10
0/10
Result
0/1
0/1
0/1
0/1
Result
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
Result
0/45
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Pg. 2