emif02-spk01f2 STMicroelectronics, emif02-spk01f2 Datasheet
emif02-spk01f2
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emif02-spk01f2 Summary of contents
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... Figure 2: Basic Cell Configuration Input GND TM: IPAD is a trademark of STMicroelectronics. October 2005 AND ESD PROTECTION Table 1: Order Code Part Number EMIF02-SPK01F2 Figure 1: Pin Configuration (bump side) Low-pass Filter GND GND REV 1 EMIF02-SPK01F2 2 LINE EMI FILTER Flip-Chip (5 Bumps) Marking GND C ...
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... EMIF02-SPK01F2 Table 2: Absolute Ratings (limiting values) Symbol Parameter and test conditions T Maximum junction temperature j T Operating temperature range op T Storage temperature range stg Table 3: Electrical Characteristics (T Symbol Parameter V Breakdown voltage BR I Leakage current @ Stand-off voltage RM V Clamping voltage CL R Dynamic impedance ...
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... V(in) and one output V(out) Figure 7: Line capacitance versus applied voltage C(pF) 250 200 150 100 Figure 6: ESD response to IEC61000-4-2 (15kV air discharge) on one input V(in) and one output V(out) F=1MHz V =30mV osc RMS T =25° EMIF02-SPK01F2 3/7 ...
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... EMIF02-SPK01F2 Figure 8: Aplac model Rbump Lbump IN1 model = D1 model = D1 IN2 Rbump Lbump EMIF02-SPK01F1 model Figure 9: Aplac parameters Model D1 CJO=Cdiode1 BV=7 IBV=1u IKF=1000 IS=10f ISR=100p N=1 M=0.3333 RS=0.7 VJ=0.6 TT=50n 4/7 Rspk Lspk Lbump Rbump model = D2 model = D3 model = D2 Rspk Lspk Lbump Rbump Model D3 Model D2 CJO=Cdiode3 CJO=Cdiode2 BV=7 BV=7 IBV=1u ...
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... Solder stencil opening : 330µm Solder mask opening recommendation : 340µm min for 315µm copper pad diameter EMIF yy 315µm ± 50 1.07mm ± 50µm Figure 13: Marking Dot, ST logo xx = marking z = manufacturing location yww = datecode (y = year ww = week) EMIF02-SPK01F2 - xxx zz Fx 650µm ± 5/7 ...
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... ECOPACK trademark. ECOPACK specifications are available at: www.st.com. Table 4: Ordering Information Ordering code Marking EMIF02-SPK01F2 FX Note: More packing informations are available in the application notes AN1235: ''Flip-Chip: Package description and recommandations for use'' AN1751: "EMI Filters: Recommendations and measurements" ...
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