DS1217 DALLAS [Dallas Semiconductor], DS1217 Datasheet - Page 8
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DS1217
Manufacturer Part Number
DS1217
Description
Nonvolatile Read/Write Cartridge
Manufacturer
DALLAS [Dallas Semiconductor]
Datasheet
1.DS1217.pdf
(8 pages)
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
DS1217A/
Manufacturer:
SILICONIX
Quantity:
132
NOTES:
1. WE is high for a read cycle.
2. OE = V
3. t
4. t
5. These parameters are sampled with a 5pF load and are not 100% tested.
6. If the CE low transition occurs simultaneously with or later than the WE low transition in Write Cycle 1, the
7. If the CE high transition occurs prior to or simultaneously with the WE high transition in Write Cycle 1, the
8. If WE is low or the WE low transition occurs prior to or simultaneously with the CE low transition, the output
9. Each DS1217A is marked with a 4-digit date code AABB. AA designates the year of manufacture; BB desig-
10. Removing and installing the cartridge with power applied may disturb data.
DC TEST CONDITIONS
Outputs Open
t Cycle = 250ns
All Voltages Are Referenced to Ground
DS1217A
030598 8/8
the earlier of CE or WE going high.
output buffers remain in a high impedance state during this period.
output buffers remain in a high impedance state during this period.
buffers remains in a high impedance state during this period.
nates the week of manufacture. The expected t
WP
DH
, t
is specified as the logical AND of CE and WE. t
DS
IH
are measured from the earlier of CE or WE going high.
or V
IL
. If OE = V
IH
during the write cycle, the output buffers remain in a high impedance state.
DR
is defined as starting at the date of manufacture.
WP
is measured from the latter of CE or WE going low to
AC TEST CONDITIONS
Output Load: 100pF + 1TTL Gate
Input Pulse Levels: 0 - 3.0V
Timing Measurement Reference Levels
Input: 1.5 V