AD5112 AD [Analog Devices], AD5112 Datasheet - Page 4

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AD5112

Manufacturer Part Number
AD5112
Description
Manufacturer
AD [Analog Devices]
Datasheet

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
AD5112BCPZ10-RL7
Manufacturer:
ADI/亚德诺
Quantity:
20 000
AD5111/AD5113/AD5115
Parameter
DYNAMIC CHARACTERISTICS
FLASH/EE MEMORY RELIABILITY
1
2
3
4
5
6
7
8
9
10
11
12
Typical values represent average readings at 25°C, V
R-INL is the deviation from an ideal value measured between the maximum resistance and the minimum resistance wiper positions. R-DNL measures the relative step
change from ideal between successive tap positions. The maximum wiper current is limited to 0.8 × V
Guaranteed by design and characterization; not subject to production test.
INL and DNL are measured at V
of ±1 LSB maximum are guaranteed monotonic operating conditions.
Resistor Terminal A, Resistor Terminal B, and Resistor Terminal W have no limitations on current direction with respect to each other.
C
Different from operating current; supply current for NVM program lasts approximately 30 ms.
Different from operating current; supply current for NVM read lasts approximately 20 μs.
P
derates with junction temperature in the Flash/EE memory.
All dynamic characteristics use V
Endurance is qualified at 100,000 cycles per JEDEC Standard 22, Method A117 and measured at 150°C.
Retention lifetime equivalent at junction temperature (T
A
DISS
Bandwidth
Total Harmonic Distortion
V
Resistor Noise Density
Endurance
Data Retention
is measured with V
W
is calculated from (I
Settling Time
11
12
W
= V
DD
× V
A
= 2.5 V, C
DD
WB
3
).
, 10
DD
with the RDAC configured as a potentiometer divider similar to a voltage output DAC. V
3
= 5.5 V and V
B
is measured with V
LOGIC
Symbol
BW
THD
t
e
DD
s
N_WB
= 5 V.
= 5 V, V
J
) is 125°C per JEDEC Standard 22, Method A117. Retention lifetime based on an activation energy of 1 eV
W
= V
SS
B
= 0 V, and V
= 2.5 V, and C
Rev. 0 | Page 4 of 24
LOGIC
Test Conditions/Comments
Code = half scale, −3 dB
R
R
V
2, f = 1 kHz, code = half scale
R
R
V
error band
R
R
Code = half scale, T
f = 100 kHz
R
R
T
A
AB
AB
A
AB
AB
A
AB
AB
AB
AB
W
= V
= 5 V, V
= 25°C
is measured with V
= 10 kΩ
= 80 kΩ
= 10 kΩ
= 80 kΩ
= 10 kΩ
= 80 kΩ
= 10 kΩ
= 80 kΩ
= 5 V.
DD
/2 + 1 V rms, V
B
= 0 V, ±0.5 LSB
A
A
= 25°C,
B
= V
= V
DD
B
/R
= 2.5 V.
DD
AB
/
.
Min
100
A
= V
DD
Typ
2
200
−80
−85
3
12
9
20
1
50
and V
1
B
= 0 V. DNL specification limits
Max
Data Sheet
Unit
MHz
kHz
dB
dB
μs
μs
nV/√Hz
nV/√Hz
MCycles
kCycles
Years

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