DAC312BR/883 Analog Devices, DAC312BR/883 Datasheet - Page 4

• Manufacturer Part Number: DAC312BR/883
• Description: 12-Bit High Speed Multiplying D/A Converter
• Manufacturer: Analog Devices

DAC312
DICE CHARACTERISTICS
WAFER TEST LIMITS
Parameter
Resolution
Monotonicity
Nonlinearity
Output Voltage
Full-Scale
Full-Scale Symmetry
Zero-Scale Current
Differential
Logic Input Levels “0”
Logic Input Levels “1”
Logic Input Swing
Reference Bias
Power Supply
Power Supply
Power
NOTE
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
DIE SIZE 0.141
Compliance
Current
Nonlinearity
Current
Sensitivity
Current
Dissipation
0.096 inch, 13,536 sq. mils (3.58
Symbol
Voc
I
I
DNL
V
V
V
I
PSSI
PSSI
I+
I–
P
FSS
ZS
15
D
IL
IH
IS
@ V
FS+
FS–
S
=
15 V, I
Ideal Step Size
Conditions
Full-Scale Current
Change <1/2 LSB
V
R
Deviation from
V
V
V+ = +13.5 V to +16.5 V, V– = –15 V
V– = –13.5 V to –16.5 V, V+ = +15 V
V
I
V
I
REF
REF
REF
14
LC
LC
S
S
REF
= +15 V
= +15 V
, R
= GND
= GND
= 1.0 mA, T
= 10.000 V
15
1.0 mA
1.0 mA
= 10.000 k
2.44 mm, 8.74 sq. mm)
A
= 25 C, unless otherwise noted. Output characteristics refer to both I
–4–
10. B10
1. B1 (MSB)
2. B2
3. B3
4. B4
5. B5
6. B6
7. B7
8. B8
9. B9
DAC312N
Limit
12
12
+10
–5
4.031
3.967
0.1
0.8
2
+18
–5
–2
7
–18
375
0.05
1
0.012
1/2
0.001
0.001
DAC312G
Limit
12
12
+10
–5
4.063
3.935
0.1
0.8
2
+18
–5
–2
7
–18
375
0.05
2
0.025
1
0.001
0.001
11. B11
12. B12 (LSB)
13. V
14. V
15. V
16. COMP
17. V–
18. I
19. I
20. V+
O
O
LC
REF
REF
/A
(+)
(–)
GND
Units
Bits min
Bits min
%FS max
V max
mA min
%FS max
V min
mW max
V min
mA max
Bits (LSB) max
V max
V max
V min
%/%max
mA max
A max
A max
A max
REV. C
OUT
and I
OUT
.