AD7118BQ AD [Analog Devices], AD7118BQ Datasheet - Page 3

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AD7118BQ

Manufacturer Part Number
AD7118BQ
Description
LOGDAC CMOS Logarithmic D/A Converter
Manufacturer
AD [Analog Devices]
Datasheet

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Company
Part Number
Manufacturer
Quantity
Price
Part Number:
AD7118BQ
Manufacturer:
ADI/亚德诺
Quantity:
20 000
REV. A
ABSOLUTE MAXIMUM RATINGS*
(T
V
V
Digital Input Voltage to DGND . . . . . –0.3 V to V
I
AGND to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 to V
DGND to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 to V
Power Dissipation (Any Package)
Operating Temperature Range
Storage Temperature . . . . . . . . . . . . . . . . . . –65 C to +150 C
Lead Temperature (Soldering, 10 sec) . . . . . . . . . . . . +300 C
*Stresses above those listed under “Absolute Maximum Ratings may cause perma-
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD7118 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
nent damage to the device. This is a stress rating only and functional operation of
the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
OUT
DD
IN
A
To +75 C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 450 mW
Derates Above +75 C by . . . . . . . . . . . . . . . . . . . 6 mW/ C
Commercial (K, L Versions) . . . . . . . . . . . . . 0 C to +70 C
Industrial (B, C Versions) . . . . . . . . . . . . . –25 C to +85 C
Extended (T, U Versions) . . . . . . . . . . . . –55 C to +125 C
= +25 C unless otherwise noted)
(to AGND) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 V
(to DGND) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +17 V
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to V
DD
+ 0.3 V
DD
DD
DD
–3–
TERMINOLOGY
RESOLUTION: Nominal change in attenuation when moving
between two adjacent binary codes.
MONOTONICITY: The device is monotonic if the analog out-
put decreases (or remains constant) as the digital code increases.
FEEDTHROUGH ERROR: That portion of the input signal
which reaches the output when all digital inputs are high. See
section on Applications.
OUTPUT LEAKAGE CURRENT: Current which appears on
the I
TOTAL HARMONIC DISTORTION: Is a measure of the
harmonics introduced by the circuit when a pure sinusoid is
applied to the input. It is expressed as the harmonic energy
divided by the fundamental energy at the output.
ACCURACY: Is the difference (measured in dB) between the
ideal transfer function as listed in Table I and the actual transfer
function as measured with the device.
OUTPUT CAPACITANCE: Capacitance from I
ground.
DIGITAL-TO-ANALOG GLITCH IMPULSE: The amount
of charge injected from the digital inputs to the analog output
when the inputs change state. This is normally specified as the
area of the glitch in either pA-secs or nV-secs depending upon
whether the glitch is measured as a current or voltage signal.
Digital charge injection is measured with V
PROPAGATION DELAY: This is a measure of the internal
delays of the circuit and is defined as the time from a digital in-
put change to the analog output current reaching 90% of its
final value.
INTERMODULATION DISTORTION: Is a measure of the
interaction which takes place within the circuit between two
sinusoids applied simultaneously to the input.
The reader is referred to Hewlett Packard Application Note 192
for further information.
OUT
Applications Information–
terminal with all digital inputs high.
WARNING!
IN
ESD SENSITIVE DEVICE
= AGND.
AD7118
OUT
to

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