TSA5060AT PHILIPS [NXP Semiconductors], TSA5060AT Datasheet - Page 10

• Manufacturer Part Number: TSA5060AT
• Description: 1.3 GHz I2C-bus controlled low phase noise frequency synthesizer
• Manufacturer: PHILIPS [NXP Semiconductors]

Philips Semiconductors
XT/COMP frequency output
It is possible to output either the crystal or the comparison
frequency at pin XT/COMP to be used in the application.
For example, to drive a second PLL synthesizer saving a
quartz crystal. To output f
to logic 1 and bit XCS to logic 0, or bit XCE to logic 0 and
bit XCS to logic 1 during a test mode, while to output f
it is necessary to set both bits XCE and XCS to logic 1.
If the output signal at this pin is not used it is recommended
to disable it by setting both bits XCE and XCS to logic 0.
Table 10 shows how this pin is programmed. At power-on,
the XT/COMP output is set with the f
Prescaler enable
The TSA5060A is able to work with the relationship
f
covering the complete terrestrial and cable frequency
range.
Table 10 XT/COMP and test mode selection; note 1
Notes
1. X = don’t care.
2. Status at Power-on reset.
2000 Oct 24
comp
1.3 GHz I
noise frequency synthesizer
XCE
0
1
1
0
0
0
0
0
= step size for an input frequency up to 1.3 GHz,
XCS
0
0
1
1
1
1
1
1
2
C-bus controlled low phase
T2
X
X
X
0
0
0
0
1
xtal
it is necessary to set bit XCE
T1
X
X
X
X
0
0
1
1
xtal
signal selected.
T0
X
X
X
X
0
1
0
1
disabled
f
f
f
f
f
f
f
xtal
comp
xtal
xtal
xtal
xtal
xtal
comp
XT/COMP OUTPUT
10
If needed, the prescaler can be selected by setting bit PE
to logic 1 while it is not in use if bit PE is set to logic 0.
If it is important to reach a low phase noise on the
controlled VCO, it is recommended to set bit PE to logic 0
and not to use the prescaler allowing the comparison
frequency to be equal to the step size.
Test modes
It is possible to access the test modes by setting bit XCE
to logic 0 and bit XCS to logic 1. One specific test mode is
then selected using bits T2, T1 and T0, as described in
Table 10.
normal operation
normal operation
normal operation
test operation: charge pump sink;
status byte bit FL = 1
test operation: charge pump source;
status byte bit FL = 0
test operation: charge pump disabled;
status byte bit FL = 0
test operation:
test operation: drive voltage (pin DRIVE)
is off (high-impedance); note 2
TEST MODE
1
2
f
DIV
Product specification
switched to Port P0
TSA5060A