M35054 MITSUBISHI [Mitsubishi Electric Semiconductor], M35054 Datasheet - Page 4

• Manufacturer Part Number: M35054
• Description: SCREEN CHARACTER and PATTERN DISPLAY CONTROLLERS???
• Manufacturer: MITSUBISHI [Mitsubishi Electric Semiconductor]

MEMORY CONSTITUTION
Address 00
to F8
The internal circuit is reset and all display control registers (address
F0
are RAM erased when the AC pin level is “L”.
When using M35054-XXXFP, set “0” in any of DA7, DAD through
DAF of addresses 00
Fig. 1 Memory constitution (M35054-XXXFP)
Fig. 2 Memory constitution (M35055-XXXFP)
4
Address
Address
00
EF
F0
F1
F2
F3
F4
F5
F6
F7
F8
00
EF
F0
F1
F2
F3
F4
F5
F6
F7
F8
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
to F8
16
16
are assigned to the display control registers.
16
16
) are set to “0” and display RAM (address 00
DA
DA
to EF
F
F
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
16
DA
DA
E
E
are assigned to the display RAM, address F0
16
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
through EF
TEST15
TEST21
TEST27
TEST33
TEST36
TEST42
TEST43
TEST46
LEVEL1
TEST15
TEST21
TEST27
TEST33
TEST36
TEST42
TEST43
TEST46
LEVEL1
__
DA
DA
D
D
0
0
0
0
Reverse
TEST14
TEST20
TEST26
TEST32
TEST35 TEST34 SPACE
TEST41
TEST45 RGBON TEST44 CL17/18 CBLINK CURS7 CURS6 CURS5 CURS4 CURS3 CURS2 CURS1 CURS0
Reverse
TEST20
TEST26
TEST32
TEST45 RGBON TEST44 CL17/18 CBLINK CURS7 CURS6 CURS5 CURS4 CURS3 CURS2 CURS1 CURS0
TEST51
TEST14
TEST35 TEST34 SPACE
TEST41
TEST51
TEST2
TEST2
DA
REV
REV
DA
REV
REV
16
C
C
, and of DAE and DAF of ad-
TEST40
TEST40
Blinking
TEST13 TEST12
TEST19
TEST31
TEST13 TEST12
TEST19
TEST31
TEST25
TEST50
TEST25
TEST50
Blinking
TEST1
TEST1
BLINK
BLINK
BLINK
BLINK
DA
DA
B
B
TEST18
TEST24
TEST18
TEST24
TEST30
TEST39 TEST38 TEST37
TEST49
TEST30
TEST39 TEST38 TEST37
TEST49
TEST0 LBLACK LIN24/32 BLKHF
TEST0 LBLACK LIN24/32 BLKHF
DA
DA
A
B
A
B
B
B
Character color
Character color
16
TEST17
TEST29
TEST17
TEST29
TEST11
TEST23
TEST48
TEST11
TEST23
TEST48
to EF
DSP9
DSP9
DA
DA
9
G
9
G
G
G
16
SCREEN CHARACTER and PATTERN DISPLAY CONTROLLERS
16
)
TEST10
TEST47
TEST16
TEST22
TEST28
TEST10
TEST16
TEST22
TEST28
TEST47
DSP8
DSP8
DA
DA
8
R
8
R
R
R
dresses F0
Setting the blank code “FF
When using M35055-XXXFP, set “0” in any of DAD through DAF of
addresses 00
F0
TESTn (n : a number) is MITSUBISHI test memory, so be sure to
observe the setting conditions.
M35054-XXXFP/M35055-XXXFP
RAMERS DSPON STOP1 STOPIN
RAMERS DSPON STOP1 STOPIN
SYSEP1 SYSEP0 SEPV1
SYSEP1 SYSEP0 SEPV1
VSZ21
VSZ21
DSP7
DSP7
16
DA
HP7
EQP
VP7
DA
HP7
VP7
EQP
C7
C7
7
7
0
0
through F8
VSZ20
VSZ20
DSP6
PALH
DSP6
PALH
16
DA
HP6
DA
HP6
VP6
VP6
C6
C6
BB
C6
BB
C6
6
6
through F8
16
16
through EF
.
VSZ11
VSZ11
DSP5
MPAL
DSP5
MPAL
DA
HP5
DA
HP5
VP5
VP5
C5
C5
BG
C5
C5
BG
5
5
MITSUBISHI MICROCOMPUTERS
16
INT/NON
INT/NON
16
SEPV0
SEPV0
.
VSZ10
VSZ10
DSP4
DSP4
DA
HP4
DA
HP4
VP4
VP4
16
Character code
C4
C4
BR
” as a character code is an exception.
C4
C4
BR
4
4
, and of DAE and DAF of addresses
Character code
LEVEL0 PHASE2 PHASE1 PHASE0
LEVEL0 PHASE2 PHASE1 PHASE0
HSZ21
HSZ21
SCOR
SCOR
DSP3
DSP3
PTD1
PTD1
DA
HP3
DA
HP3
VP3
N/P
VP3
N/P
C3
C3
C3
C3
3
3
BLINK2 BLINK1 BLINK0
BLINK2 BLINK1 BLINK0
HSZ20
HSZ20
DSP2
DSP2
PTD0
PTD0
DA
HP2
VP2
DA
HP2
VP2
C2
C2
EX
C2
C2
EX
2
2
HSZ11
HSZ11
DSP1
DSP1
PTC1
BLK1
PTC1
BLK1
DA
HP1
DA
HP1
VP1
VP1
C1
C1
C1
C1
1
1
HSZ10
HSZ10
DSP0
PTC0
BLK0
PTC0
DSP0
BLK0
DA
HP0
DA
HP0
VP0
VP0
C0
C0
C0
C0
0
0