AT49F4096-12RI ATMEL [ATMEL Corporation], AT49F4096-12RI Datasheet - Page 2

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AT49F4096-12RI

Manufacturer Part Number
AT49F4096-12RI
Description
4 Megabit 256K x 16 5-volt Only CMOS Flash Memory
Manufacturer
ATMEL [ATMEL Corporation]
Datasheet
Description (Continued)
To allow for simple in-system reprogrammability, the
AT49F4096 does not require high input voltages for pro-
gramming. Five-volt-only commands determine the read
and programming operation of the device. Reading data
out of the device is similar to reading from an EPROM; it
has standard CE, OE, and WE inputs to avoid bus conten-
tion. Reprogramming the AT49F4096 is performed by first
erasing a block of data and then programming on a word-
by-word basis.
The device is erased by executing the erase command
sequence; the device internally controls the erase opera-
tion. The memory is divided into three blocks for erase op-
erations. There are two 8K word parameter block sections
and one sector consisting of the boot block and the main
Block Diagram
Device Operation
READ: The AT49F4096 is accessed like an EPROM.
When CE and OE are low and WE is high, the data stored
at the memory location determined by the address pins is
asserted on the outputs. The outputs are put in the high
impedance state whenever CE or OE is high. This dual-
line control gives designers flexibility in preventing bus
contention.
COMMAND SEQUENCES: When the device is first pow-
ered on it will be reset to the read or standby mode de-
pending upon the state of the control line inputs. In order
to perform other device functions, a series of command
sequences are entered into the device. The command se-
quences are shown in the Command Definitions table
(I/O8 - I/O15 are don’t care inputs for the command
codes). The command sequences are written by applying
a low pulse on the WE or CE input with CE or WE low
(respectively) and OE high. The address is latched on the
falling edge of CE or WE, whichever occurs last. The data
is latched by the first rising edge of CE or WE. Standard
microprocessor write timings are used. The address loca-
tions used in the command sequences are not affected by
entering the command sequences.
4-220
AT49F4096
memory array block. The AT49F4096 is programmed on a
word-by-word basis.
The device has the capability to protect the data in the
boot block; this feature is enabled by a command se-
quence. Once the boot block programming lockout feature
is enabled, the data in the boot block cannot be changed
when input levels of 5.5 volts or less are used. The typical
number of program and erase cycles is in excess of
10,000 cycles.
The optional 8K word boot block section includes a repro-
gramming lock out feature to provide data integrity. The
boot sector is designed to contain user secure code, and
when the feature is enabled, the boot sector is protected
from being reprogrammed.
RESET: A RESET input pin is provided to ease some
system applications. When RESET is at a logic high level,
the device is in its standard operating mode. A low level on
the RESET input halts the present device operation and
puts the outputs of the device in a high impedance state.
When a high level is reasserted on the RESET pin, the
device returns to the Read or Standby mode, depending
upon the state of the control inputs. By applying a 12V
0.5V input signal to the RESET pin the boot block array
can be reprogrammed even if the boot block program lock-
out feature has been enabled (see Boot Block Program-
ming Lockout Override section).
ERASURE: Before a word can be reprogrammed, it must
be erased. The erased state of the memory bits is a logical
“1”. The entire device can be erased at one time by using
a 6-byte software code.
After the software chip erase has been initiated, the device
will internally time the erase operation so that no external
clocks are required. The maximum time needed to erase
the whole chip is t
EC
.
(continued)

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