AT49LH00B4-33TC ATMEL [ATMEL Corporation], AT49LH00B4-33TC Datasheet - Page 30
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AT49LH00B4-33TC
Manufacturer Part Number
AT49LH00B4-33TC
Description
4-megabit Top Boot, Bottom Partitioned Firmware Hub and Low-Pin Count Flash Memory
Manufacturer
ATMEL [ATMEL Corporation]
Datasheet
1.AT49LH00B4-33TC.pdf
(36 pages)
Interface Measurement Condition Parameters
Note:
Reset Operations
Note:
AC Waveform for Reset Operation
Programming and Erase Times
Notes:
30
Symbol
V
V
V
V
Input Signal Edge Rate
Symbol
t
t
Parameter
Byte Program Time
Sector Erase Time
PLPH
PHFV
TH
TL
TEST
MAX
(1)
(1)
(1)
(1)
1. The input test environment is done with 0.1 V
1. A reset latency of 20 µs will occur if a reset procedure is performed during a programming or erase operation.
1. Typical values measured at T
2. Excludes system-level overhead.
AT49LH00B4
overdrive than this. V
testing may use different voltage values, but must correlate results back to these parameters.
(2)
FWH4/LFRAME
Parameter
RST or INIT Pulse Low Time (If RST or INIT is tied to V
specification is not applicable)
RST or INIT High to FWH4/FRAME Low
(2)
RST
MAX
specifies the maximum peak-to-peak waveform allowed for measuring the input timing. Production
V
V
V
V
A
IH
IH
IL
IL
= +25° C and nominal voltages.
CC
t
PLPH
of overdrive over V
Typ
150
30
(1)
CC
t
PHFV
, this
IH
and V
IL
0.6 V
0.2 V
0.4 V
0.4 V
Value
. Timing parameters must be met with no more
CC
CC
CC
CC
Max
500
50
Min
100
1
1 V/ns
Max
Units
3379B–FLASH–9/03
V
V
V
V
Unit
ms
µs
Unit
ns
µs