28LV011RT2FI-20 MAXWELL [Maxwell Technologies], 28LV011RT2FI-20 Datasheet - Page 4

• Manufacturer Part Number: 28LV011RT2FI-20
• Description: 3.3V 1 Megabit (128K x 8-Bit) EEPROM
• Manufacturer: MAXWELL [Maxwell Technologies]

1. Test conditions: Input pulse levels - 0.4V to 2.4V; input rise and fall times < 20 ns; output load - 1 TTL gate + 100 pF (including
2. t
3. Guaranteed by design.
3.3V 1 Megabit (128K x 8-Bit) EEPROM
Functional Test
Address Access Time
Chip Enable Access Time
Output Enable Access Time
Output Hold to Address Change
Output Disable to High-Z
Output Disable to High-Z
RES to Output Delay
-200
-250
-200
-250
-200
-250
-200
-250
-200
-250
-200
-250
-200
-250
scope and jig); reference levels for measuring timing - 0.8V/1.8V.
DF
and t
DFR
P
ARAMETER
is defined as the time at which the output becomes an open circuit and data is no longer driven.
3
T
ABLE
2
(V
7. 28LV011 AC C
CC
Verify Truth Table
OE = V
CE = V
CE = OE = V
CE = OE = V
CE = OE = V
CE = OE = V
CE = OE = V
CE = V
CE = V
= 3.3V ± 10%, T
T
IL
IL
EST
IL
IL
, WE = V
, WE = V
, WE = V
, WE = V
C
ONDITIONS
IL
IL
IL
IL
IL
, WE = V
, WE = V
, WE = V
, WE = V
WE = V
A
IH
IH
IH
IH
= -55
HARACTERISTICS FOR
05.28.02 Rev 2
IH
IH
TO
IH
IH
IH
+125 °C
S
7, 8A, 8B
9, 10, 11
9, 10, 11
9, 10, 11
9, 10, 11
9, 10, 11
9, 10, 11
9, 10, 11
UBGROUPS
UNLESS OTHERWISE SPECIFIED
All data sheets are subject to change without notice
S
R
YMBOL
t
t
ACC
t
t
t
t
t
All
DFR
EAD
OH
CE
OE
DF
RR
O
PERATION 1
M
--
--
--
--
)
0
0
0
0
0
0
0
0
0
0
IN
©2002 Maxwell Technologies
28LV011
M
200
250
200
250
120
300
350
525
550
110
50
50
--
--
AX
All rights reserved.
U
ns
ns
ns
ns
ns
ns
ns
NIT
4