TMP01GBC AD [Analog Devices], TMP01GBC Datasheet - Page 4

• Manufacturer Part Number: TMP01GBC
• Description: Low Power, Programmable Temperature Controller
• Manufacturer: AD [Analog Devices]

TMP01
WAFER TEST LIMITS
Parameter
INPUTS SET HIGH, SET LOW
OUTPUT VPTAT
OUTPUT VREF
OPEN-COLLECTOR OUTPUTS OVER, UNDER
POWER SUPPLY
NOTES
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
Input Bias Current
Temperature Accuracy
Nominal Value
Line Regulation
Load Regulation
Output Low Voltage
Output Low Voltage
Output Leakage Current
Supply Range
Supply Current
8
1
(V
DD
= +5.0 V, GND = 0 V, T
For additional DICE ordering information, refer to databook.
Symbol
I
VREF
V
V
I
V+
I
B
OH
SY
OL
OL
2
7
Die Size 0.078
3
6
DICE CHARACTERISTICS
(1.98
Conditions
T
T
4.5 V
10 A
I
I
Unloaded
SINK
SINK
A
A
A
Transistor Count: 105
= +25 C, unless otherwise noted)
= +25 C, No Load
= +25 C, No Load
1.80 mm, 3.57 sq. mm)
= 1.6 mA
= 20 mA
0.071 inch, 5,538 sq. mils
V+
I
VREF
–4–
4
5
13.2 V
4
500 A
1. VREF
2. SETHIGH
3. SETLOW
4. GND (TWO PLACES)
5. VPTAT
6. UNDER
7. OVER
8. V+
(CONNECTED TO SUBSTRATE)
Min
2.490
4.5
Typ
Max
100
1.5
2.510
0.4
1.0
100
13.2
600
0.05
0.25
V
Units
nA
V
%/V
%/mA
mV
V
C
A
A
REV. C