AM28F020 Advanced Micro Devices, AM28F020 Datasheet - Page 25

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AM28F020

Manufacturer Part Number
AM28F020
Description
2 Megabit (256 K x 8-Bit) CMOS 12.0 Volt/ Bulk Erase Flash Memory
Manufacturer
Advanced Micro Devices
Datasheet

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TEST CONDITIONS
Note: Diodes are IN3064 or equivalent
Device
Under
Test
30
25
20
15
10
0
5
0
Figure 6.
1
C L
Figure 5. Am28F020—Average I
Test Setup
2
6.2 k
3
VCC = 5.5 V, Addressing Pattern = Minmax
5.0 V
4
Data Pattern = Checkerboard
14727F-14
2.7 k
Frequency in MHz
5
Am28F020
6
Output Load
Output Load Capacitance, C
(including jig capacitance)
Input Rise and Fall Times
Input Pulse Levels
Input timing measurement
reference levels
Output timing measurement
reference levels
CC
7
Active vs. Frequency
Test Condition
Table 6. Test Specifications
8
9
L
10
0.0–3.0
–55 C
0 C
25 C
70 C
125 C
-70
1.5
1.5
30
11
1 TTL gate
14727F-13
10
All others
0.45–2.4
0.8, 2.0
0.8, 2.0
100
12
Unit
pF
ns
V
V
V
25

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