EVAL-AD5932EB AD [Analog Devices], EVAL-AD5932EB Datasheet - Page 5
EVAL-AD5932EB
Manufacturer Part Number
EVAL-AD5932EB
Description
Programmable Frequency Scan Waveform Generator
Manufacturer
AD [Analog Devices]
Datasheet
1.EVAL-AD5932EB.pdf
(28 pages)
- Current page: 5 of 28
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Parameter
1
2
SPECIFICATIONS TEST CIRCUIT
Operating temperature range is as follows: Y version: −40°C to +125°C; typical specifications are at +25°C.
Guaranteed by design, not production tested.
Low Power Sleep Mode
100nF
Min
AD5932
REGULATOR
Figure 2. Test Circuit Used to Test the Specifications
10nF
CAP/2.5V
Y Grade
12
Typ
20
140
ROM
Rev. 0 | Page 5 of 28
SIN
1
Max
85
240
AVDD
10-BIT
DAC
COMP
10nF
Unit
μA
μA
VOUT
Test Conditions/Comments
Device is reset before putting into standby
All outputs powered down, MCLK active,
All outputs powered down, MCLK = 0 V,
serial interface active
serial interface active
20pF
AD5932
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