MC74VHCT139ADTR2 ON Semiconductor, MC74VHCT139ADTR2 Datasheet - Page 3

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MC74VHCT139ADTR2

Manufacturer Part Number
MC74VHCT139ADTR2
Description
IC DCODER/DEMUX DUAL 2-4 16TSSOP
Manufacturer
ON Semiconductor
Series
74VHCTr
Type
Decoder/Demultiplexerr
Datasheet

Specifications of MC74VHCT139ADTR2

Circuit
1 x 2:4
Independent Circuits
2
Current - Output High, Low
8mA, 8mA
Voltage Supply Source
Single Supply
Voltage - Supply
4.5 V ~ 5.5 V
Operating Temperature
-55°C ~ 125°C
Mounting Type
Surface Mount
Package / Case
16-TSSOP
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Other names
MC74VHCT139ADTR2OS
MC74VHCT139ADTR2OS-N
MC74VHCT139ADTROS
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
1. Maximum Ratings are those values beyond which damage to the device may occur. Functional operation should be restricted to the
2. Tested to EIA/JESD22−A114−A
3. Tested to EIA/JESD22−A115−A
4. Tested to JESD22−C101−A
5. Tested to EIA/JESD78
DEVICE JUNCTION TEMPERATURE VERSUS TIME
TO 0.1% BOND FAILURES
MAXIMUM RATINGS
RECOMMENDED OPERATING CONDITIONS
I
Symbol
Symbol
Temperature C
LATCHUP
Recommended Operating Conditions.
V
V
T
V
I
V
V
V
q
V
t
I
OUT
I
P
OUT
I
STG
ESD
OUT
T
r
OK
CC
, t
CC
IK
JA
CC
Junction
IN
IN
A
D
f
100
110
120
130
140
80
90
Positive DC Supply Voltage
Digital Input Voltage
DC Output Voltage
Input Diode Current
Output Diode Current
DC Output Current, per Pin
DC Supply Current, V
Power Dissipation in Still Air
Storage Temperature Range
ESD Withstand Voltage
Latchup Performance
Thermal Resistance, Junction−to−Ambient
DC Supply Voltage
DC Input Voltage
DC Output Voltage Output in 3−State
Operating Temperature Range, all Package Types
Input Rise or Fall Time
High or Low State
(Note 1)
Time, Hours
1,032,200
419,300
178,700
79,600
37,000
17,800
8,900
CC
and GND Pins
V
CC
Time, Years
Characteristics
= 5.0 V + 0.5 V
117.8
Parameter
47.9
20.4
Above V
9.4
4.2
2.0
1.0
MC74VHCT139A
http://onsemi.com
CC
and Below GND at 125 C (Note 5)
Charged Device Model (Note 4)
3
Human Body Model (Note 2)
Figure 6. Failure Rate vs. Time Junction Temperature
Machine Model (Note 3)
1
High or Low State
Output in 3−State
1
SOIC Package
SOIC Package
FAILURE RATE OF PLASTIC = CERAMIC
UNTIL INTERMETALLICS OCCUR
TSSOP
TSSOP
10
TIME, YEARS
Min
−55
−0.5 to V
4.5
0
0
0
0
−0.5 to +7.0
−0.5 to +7.0
−0.5 to +7.0
−65 to +150
>2000
>2000
Value
$300
>200
$20
$25
$75
−20
200
180
143
164
CC
100
+0.5
Max
V
125
5.5
5.5
5.5
20
CC
1000
ns/V
Unit
Unit
mW
C/W
mA
mA
mA
mA
mA
V
V
V
V
V
V
V
C
C

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