SAA5249GP/E PHILIPS [NXP Semiconductors], SAA5249GP/E Datasheet - Page 9

• Manufacturer Part Number: SAA5249GP/E
• Description: Integrated VIP and Teletext with Background Memory Controller IVT1.1BMCX
• Manufacturer: PHILIPS [NXP Semiconductors]

Philips Semiconductors
Group A
Table 1 Acceptance tests per lot
Group B
Table 2 Processability tests (by package family)
Group C
Table 3 Reliability tests (by process family)
Table 4 Reliability tests (by device type)
Note to Tables 1 to 4
1. ppm = fraction of defective devices, in parts per million.
1996 Nov 07
Mechanical
Electrical
Solderability
Mechanical
Solder heat resistance
Operational life
Humidity life
Temperature cycling performance
ESD and latch-up
Integrated VIP and Teletext with
Background Memory Controller
LTPD = Lot Tolerance Percent Defective.
FPM = fraction of devices failing at test condition, in Failures Per Million.
FITS = Failures In Time Standard.
TEST
TEST
TEST
TEST
168 hours at T
temperature, humidity, bias
(1000 hours, 85 C, 85% RH or
equivalent test)
T
ESD Human body model
2000 V, 100 pF, 1.5 k
ESD Machine model
200 V, 100 pF, 1.5 k
latch-up 100 mA, 1.5
(absolute maximum)
stg(min)
to T
CONDITIONS
CONDITIONS
stg(max)
j
= 150 C
9
cumulative target: <100 ppm
cumulative target: <100 ppm
<7% LTPD
<15% LTPD
<15% LTPD
V
DD
REQUIREMENTS
REQUIREMENTS
<1500 FPM; equivalent to <100 FITS
at T
<2000 FPM
<2000 FPM
<15% LTPD
<15% LTPD
<15% LTPD
j
= 70 C
REQUIREMENTS
REQUIREMENTS
Preliminary specification
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(1)
SAA5249
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