EVM6436 SEMTECH [Semtech Corporation], EVM6436 Datasheet
EVM6436
Related parts for EVM6436
EVM6436 Summary of contents
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TEST AND MEASUREMENT PRODUCTS Description The Edge6435/6436 is a low-cost, 40-channel, monolithic ATE level DAC solution manufactured in a wide-voltage bi-CMOS process. The Edge6435/6436 features independent buffered voltage and current outputs that are serially programmed and can be used to ...
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TEST AND MEASUREMENT PRODUCTS Functional Block Diagram TESTMODE SHIFTOUT* 2006 Semtech Corp. / Rev. 3, 8/25/06 SDIN CLKIN DAC 0 DACEN UPDATE STORE LOAD RANK RESET* DAC 39 SDOUT LDOUT DACOUT 2 Edge6435/6436 Channel 0 4 VOUTA 2 VOUTB 2 ...
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TEST AND MEASUREMENT PRODUCTS PIN Description ...
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TEST AND MEASUREMENT PRODUCTS PIN Description (continued ...
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TEST AND MEASUREMENT PRODUCTS PIN Description (continued ...
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TEST AND MEASUREMENT PRODUCTS PIN Description (continued) 1 IOUTD_2 2 AVEE 3 AVEE 4 VREF 5 R_IGAIN_D 6 DACEN 7 RESET* 8 SHIFTOUT* 9 UPDATE 10 STORE 11 FORMAT 12 SDIN 13 LD_OUT 14 CLKIN 15 LOAD 16 TEST_MODE 17 ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description Chip Overview The Edge6435/6436 provides 40 output levels. These outputs can easily be configured to generate the specific analog voltage and current requirements for channels of ATE pin electronics including: – ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) Voltage Outputs DACs (Groups The output voltage of each E6435/6436 V function of external resistor values (R_MASTER, R_VGAIN and R_OFFSET), a reference voltage level (V of digital offset and gain ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) Current Output DACs (Groups C, D) Group C DACs The output current of each Group C Current DAC is a function of an external resistor value (R_IGAIN_C), a reference voltage level (V ), ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) Circuit Description (continued) RESET* RESET* low resets the input shift register (no CLKIN required), the central register, and input registers. With RESET* high, the following leading edge of CLKIN will cause reset condition ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) Serial Programming The Edge6435/6436 is programmed with 24-bit serial data (Figure 6) in either a 4 channel (Figure Channel (Figure 5) format. Following the input of serial data ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) Decode and Individual DAC Update DACSEL0 DACSEL1 ADDRESS AND SET DECODERS FORMAT DISABLE LOAD CLKIN SDIN S RESET* Programming Logic NOTE: Not shown is the function of the Latched Data ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) D[12:0] STORE D V SR0 DACSEL D[9: SR1 D[9: SR2 D[9: SR3 D[9: SR4 CALSEL R KEY: V: Value Latch that contains DATA ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) D[12:7] STORE SR0 DACSEL SR1 SR2 SR3 D[8:7] SR4 KEY: VA, VB, VC, VD: VS: Figure 3. Details of DAC Data Latches for 6 Bit DACs (Group D) 2006 Semtech Corp. / Rev. ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued D12 D11 D10 D9 MSB REGISTER Figure 4. Format of Address and Data in Shift Register (4 Channel Format D12 D11 D10 D9 MSB REGISTER Figure 5. ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued MSB REGISTER Figure 7. Format of Address and Data for Programming to SET REGISTER (4 Channel Format MSB REGISTER Figure 8. ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued MSB REGISTER D12 D11 D10 D9 MSB If Set 4 is selected, then channel’s DAC value or Function will be ‘stored’. If Set 3 ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) Group A 13-bit V Reserved Group B 13-bit V VOUTC_0, IOUTC_0 Group C 13-bit V/I VOUTC_1, IOUTC_1 Group D 6-bit I (Note 1) PINCAST Register 0 Reserved Select Rank 1 Calibration Registers Select ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) Parallel Load of All DACs Parallel Load of denoted VOUTA_0 VOUTA DACs assigned to the VOUTA_4 PINCAST "Set" addressed VOUTA_8 using the PS2, PS1, PS0 VOUTA_12 bits (PS0 is LSB). Parallel Load of ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) VOUTA_0 Group A 13-bit V VOUTA_2 Reserved Group B 13-bit V VOUTB_0 Group C 13-bit V/I VOUTC_0, IOUTC_0 Group D 6-bit I (Note 1) IOUTD_0 PINCAST Register 0 Select Rank 1 Calibration Registers ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) Group A 13-bit V Reserved Group B 13-bit V Group C 13-bit V/I VOUTC_4, IOUTC_4 Group D 6-bit I (Note 1) PINCAST Register 0 Select Rank 1 Calibration Registers Select Rank 2 Calibration ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) Parallel Load of All DACs Parallel Load of denoted VOUTA DACs assigned to the PINCAST "Set" addressed using the PS2, PS1, PS0 bits (PS0 is LSB). Parallel Load of denoted VOUTA DACs assigned ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) Digital Inputs All digital inputs are LV_TTL compatible inputs. Digital Outputs SDOUT and LDOUT are CMOS outputs that switch between DGND and DVDD. Power Supply Sequence Power supplies must be controlled such that ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) Current Outputs The TEST_MODE and DAC_OUT pins on the Edge6435/ 6436 are used in the same way as for voltage outputs. The scan circuits for current outputs are shown in Figure 13. The ...
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TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) Latched Data readback via LD_OUT Figure 14 provides a Functional Block Diagram of the means to readback, via LD_OUT, the status of latch’s input into a selected DAC. A DAC’s latches are addressed ...
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TEST AND MEASUREMENT PRODUCTS Application Information Typical 0V +10.0V Supplies SGND AVCC RANK 10 K DACEN 10 K RESET REF I REF GND connect to the same ground as AGND pins or may be connected to DUT ...
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TEST AND MEASUREMENT PRODUCTS Application Information (continued) The E6435/E6436 can be configured to provide all of the DAC levels required for 4 fully-featured high-speed pin channels or 8 fully-featured low-speed pin channels when used with other Semtech pin electronics components. ...
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TEST AND MEASUREMENT PRODUCTS Application Information (continued) Low-Speed Pin Electronics Solution: 1 – E6435/E6436 per 8 Channels 2 – E7804 Quad Channel, Driver + Comparator + CTC per 8 Channels devices per 4 Channels 4 – E42X7 Dual-Channel, Parametric Measure- ...
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TEST AND MEASUREMENT PRODUCTS Package Information Figure 16 2.0 mm, 100-Pin MQFP (with Internal Heat Spreader, Requires Heat Sink) N PIN Descriptions 1 –A– –D– Notes: 1. All dimensions in millimeters (mm). 2. ...
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TEST AND MEASUREMENT PRODUCTS Recommended Operating Conditions ...
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TEST AND MEASUREMENT PRODUCTS Absolute Maximum Ratings ...
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TEST AND MEASUREMENT PRODUCTS DC Characteristics ...
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TEST AND MEASUREMENT PRODUCTS DC Characteristics (continued ...
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TEST AND MEASUREMENT PRODUCTS DC Characteristics (continued) Offset Error = Deviation of Real DAC from Ideal DAC at Min Code Range error and offset error are due to E6435/6436 only. External resistor tolerances and VREF tolerance not included. Figure 17. ...
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TEST AND MEASUREMENT PRODUCTS DC Characteristics (continued) Measured DAC Output at Min Code Figure 19. Representation of 2-Point DAC Integral Non-Linearity (INL) DAC Output (LSB Figure ...
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TEST AND MEASUREMENT PRODUCTS DC Characteristics (continued) Power Supplies ...
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TEST AND MEASUREMENT PRODUCTS AC Characteristics ...
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TEST AND MEASUREMENT PRODUCTS AC Characteristics (continued) Note 1: DAC_OUT Readback Time is the amount of time required for DAC_OUT to display a valid voltage for a selected (and fully settled) DAC channel and only includes channel-to-channel switching time. Note ...
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TEST AND MEASUREMENT PRODUCTS AC Characteristics (continued) 2006 Semtech Corp. / Rev. 3, 8/25/06 Figure 23. RESET* and DACEN Timing STORE or UPDATE 1 C RANK, > TESTMODE LOAD 1 C CLKIN TSU_SOUT THLD_SOUT SHIFTOUT* TO_LDOUT LDOUT Figure ...
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TEST AND MEASUREMENT PRODUCTS Ordering Information M Contact Information 10021 Willow Creek Rd., San Diego, CA 92131 Phone: (858)695-1808 FAX (858)695-2633 2006 Semtech Corp. / Rev. 3, 8/25/ ...