K7I161882B-FC16 SAMSUNG [Samsung semiconductor], K7I161882B-FC16 Datasheet - Page 10

• Manufacturer Part Number: K7I161882B-FC16
• Description: 512Kx36-bit, 1Mx18-bit DDRII CIO b2 SRAM
• Manufacturer: SAMSUNG [Samsung semiconductor]

Note: For power-up, V
AC ELECTRICAL CHARACTERISTICS
Notes: 1. This condition is for AC function test only, not for AC parameter test.
K7I163682B
K7I161882B
OPERATING CONDITIONS
AC TEST CONDITIONS
Note: Parameters are tested with RQ=250Ω
Overershoot Timing
Input High Voltage
Input Low Voltage
Supply Voltage
Reference Voltage
Ground
Output Power Supply Voltage
Output Timing Reference Level
Core Power Supply Voltage
Input High/Low Level
Input Reference Level
Input Rise/Fall Time
V
V
DDQ
DDQ
2. To maintain a valid level, the transitioning edge of the input must :
a) Sustain a constant slew rate from the current AC level through the target AC level, V
b) Reach at least the target AC level
c) After the AC target level is reached, continue to maintain at least the target DC level, V
+0.25V
V
V
+0.5V
IL
DDQ
Parameter
PARAMETER
PARAMETER
IH
≤ V
DDQ
20% t
+0.3V and V
KHKH
(MIN)
DD
(0°C ≤ T
Symbol
V
≤ 1.7V and V
T
V
V
V
IH
R
DDQ
REF
DD
/V
/T
F
IL
A
≤ 70°C)
DDQ
1.25/0.25
SYMBOL
SYMBOL
1.7~1.9
1.4~1.9
V
V
V
0.3/0.3
Value
IH
0.75
IL
DDQ
V
≤ 1.4V t ≤ 200ms
V
(V
V
V
DDQ
REF
(AC)
(AC)
DD
SS
DD
/2
512Kx36 & 1Mx18 DDRII CIO b2 SRAM
=1.8V ±0.1V, T
- 10 -
Undershoot Timing
Unit
ns
V
V
V
V
V
V
V
SS
SS
V
-0.5V
-0.25V
REF
V
V
A
=0°C to +70°C)
IH
SS
MIN
AC TEST OUTPUT LOAD
0.68
MIN
1.7
1.4
-
0
+ 0.2
IL(AC)
SRAM
IL(DC)
or V
or V
IH(AC)
V
IH(DC)
REF
ZQ
V
20% t
REF
MAX
-
MAX
250Ω
0.95
0.75V
KHKH
1.9
1.9
- 0.2
0
(MIN)
Zo=50Ω
UNIT
V
V
UNIT
V
V
V
V
V
NOTES
July. 2004
DDQ
1,2
1,2
Rev 3.1
/2
50Ω