STM32F051K4U6 STMicroelectronics, STM32F051K4U6 Datasheet - Page 65

• Manufacturer Part Number: STM32F051K4U6
• Description: ARM Microcontrollers - MCU Entry-Level ARM M0 16kB 2.0V to 3.6V
• Manufacturer: STMicroelectronics

Specifications of STM32F051K4U6

• Product Category: ARM Microcontrollers - MCU
• Rohs: yes
• Core: ARM Cortex M0
• Processor Series: STM32F051xx
• Data Bus Width: 32 bit
• Maximum Clock Frequency: 48 MHz
• Program Memory Size: 16 KB
• Data Ram Size: 8 KB
• On-chip Adc: Yes
• Operating Supply Voltage: 2 V to 3.6 V
• Operating Temperature Range: - 40 C to + 85 C
• Package / Case: UFQFN-48
• Mounting Style: SMD/SMT

Electrical characteristics
6.3.10
66/105
EMC characteristics
Susceptibility tests are performed on a sample basis during device characterization.
Functional EMS (electromagnetic susceptibility)
While a simple application is executed on the device (toggling 2 LEDs through I/O ports). the
device is stressed by two electromagnetic events until a failure occurs. The failure is
indicated by the LEDs:
●
●
A device reset allows normal operations to be resumed.
The test results are given in
defined in application note AN1709.
Table 45.
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
●
●
●
V
V
Symbol
FESD
EFTB
Electrostatic discharge (ESD) (positive and negative) is applied to all device pins until
a functional disturbance occurs. This test is compliant with the IEC 61000-4-2 standard.
FTB: A Burst of Fast Transient voltage (positive and negative) is applied to V
V
compliant with the IEC 61000-4-4 standard.
Corrupted program counter
Unexpected reset
Critical Data corruption (control registers...)
SS
through a 100 pF capacitor, until a functional disturbance occurs. This test is
Voltage limits to be applied on any I/O pin to
induce a functional disturbance
Fast transient voltage burst limits to be
applied through 100 pF on V
pins to induce a functional disturbance
EMS characteristics
Parameter
Table
Doc ID 022265 Rev 3
45. They are based on the EMS levels and classes
DD
and V
SS
V
f
conforms to IEC 61000-4-2
V
f
conforms to IEC 61000-4-4
HCLK
HCLK
DD
DD
= 3.3 V, LQFP64, T
= 3.3 V, LQFP64, T
= 48 MHz
= 48 MHz
Conditions
A
A
= +25 °C,
= +25 °C,
STM32F051x
DD
and
Level/
Class
2B
3B