LCMXO2-4000HC-4FG484C Lattice, LCMXO2-4000HC-4FG484C Datasheet - Page 11
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LCMXO2-4000HC-4FG484C
Manufacturer Part Number
LCMXO2-4000HC-4FG484C
Description
FPGA - Field Programmable Gate Array 4320 LUTs 279 IO 3.3V 4 Spd
Manufacturer
Lattice
Datasheet
1.LCMXO2280E-4BN256C.pdf
(30 pages)
Specifications of LCMXO2-4000HC-4FG484C
Rohs
yes
Number Of Gates
4 K
Embedded Block Ram - Ebr
92 Kbit
Number Of I/os
279
Maximum Operating Frequency
269 MHz
Operating Supply Voltage
1.14 V to 3.465 V, 2.375 V to 3.465 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Package / Case
fpBGA-484
Distributed Ram
34 Kbit
Minimum Operating Temperature
0 C
Operating Supply Current
8.45 mA
Factory Pack Quantity
60
User Flash Memory - Ufm
96 Kbit
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
LCMXO2-4000HC-4FG484C
Manufacturer:
Lattice Semiconductor Corporation
Quantity:
10 000
* ELFR units did not receive Flash cell pre-condition cycling prior to stress.
** FTG256 packaged units did not receive Flash cell pre-condition cycling prior to stress.
A: FAR#1389: One temperature-sensitive device was a test escape Pre-HTOL stress. Not an HTOL failure. Unit removed from sample size.
B: FAR#1390: One working unit at 1k hr failed for flash “readback. Flash verified as good. Intermittent “Read” circuit. Not able to localize.
C: No FAR. One unit mechanically damaged due to handling. No longer able to retest that device. Unit removed from sample size.
D: Two (2) pre-production ELFR failures due to too-thin ILD0. A pre-production corrective & preventive process change was incorporated
and then validated using Flash Extended Endurance, High Temperature Data Retention, and High Temperature Operating Life stresses.
INDEX Return
LCMXO2-1200HE
LCMXO2-1200HC
LCMXO2-1200HE
LCMXO2-1200HC
LCMXO2-1200HE
LCMXO2-1200HC
LCMXO2-1200HE
LCMXO2-1200HC
LCMXO2-1200HE
LCMXO2-1200HC
LCMXO2-7000HE
LCMXO2-7000HC
LCMXO2-7000HE
LCMXO2-7000HC
LCMXO2-7000HE
LCMXO2-7000HC
LCMXO2-7000HE
LCMXO2-7000HC
LCMXO2-1200ZE
LCMXO2-1200ZE
LCMXO2-1200ZE
LCMXO2-1200ZE
LCMXO2-1200ZE
LCMXO2-7000ZE
LCMXO2-7000ZE
LCMXO2-7000ZE
LCMXO2-7000ZE
Product Name
Package
FTG256
FTG256
FTG256
FTG256
FTG256
FTG256
MG132
MG132
MG132
MG132
MG132
MG132
MG132
MG132
MG132
TG144
TG144
TG144
TG144
TG144
TG144
TG144
TG144
TG144
TG144
TG144
TG144
Lot #3
Lot #3
Lot #3
Lot #3
Lot #3
Lot #3
Lot #3
Lot #3
Lot #3
Lot #6
Lot #6
Lot #6
Lot #6
Lot #6
Lot #6
Lot #1
Lot #1
Lot #1
Lot #1
Lot #1
Lot #1
Lot #2
Lot #2
Lot #2
Lot #2
Lot #2
Lot #2
Lot #
MachXO2 Cumulative Life Testing Device Hours = 2,344,000
MachXO2 Cumulative Result = 1 confirmed failure at 1000 hours
MachXO2 Long Term Failure Rate = 10 FIT
FIT Assumptions: CL=60%, AE=0.7eV, Tjref=55C
MachXO2 HTOL (2000 Hrs) Cumulative Result / Sample Size = 0 / 532
MachXO2 HTOL (1000 Hrs) Cumulative Result / Sample Size = 1 / 1,812
MachXO2 ELFR (48HRS or 168Hrs) Cumulative Result / Sample Size = 2
300*
299*
300*
40**
40**
40**
40**
40**
40**
Qty
59
60
60
50
49
50
60
60
60
48
49
50
50
48
48
50
48
48
48 Hrs
Result
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
0
0
0
11
168 Hrs
Result
N/A
N/A
N/A
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
500 Hrs
Result
N/A
N/A
N/A
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Lattice Semiconductor Corporation Doc. #25-106923 Rev. F
1000 Hrs
Result
N/A
N/A
N/A
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
B
2000 Hrs
Result
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Cumulative
100,000
100,000
100,000
100,000
59,000
60,000
60,000
98,000
60,000
60,000
60,000
48,000
49,000
50,000
80,000
80,000
80,000
96,000
96,000
80,000
80,000
80,000
96,000
96,000
Hours
D
N/A
N/A
N/A
/ 4,503