MAX3346EEUD Maxim Integrated, MAX3346EEUD Datasheet - Page 13

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MAX3346EEUD

Manufacturer Part Number
MAX3346EEUD
Description
USB Interface IC
Manufacturer
Maxim Integrated
Datasheet

Specifications of MAX3346EEUD

Product
USB 2.0
Data Rate
12 Mbps, 480 Mbps
Operating Supply Voltage
1.65 V to 3.6 V, 4 V to 5.5 V
Operating Supply Current
6 mA, 8 mA

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Quantity
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Part Number:
MAX3346EEUD
Manufacturer:
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The IEC 1000-4-2 standard covers ESD testing and
performance of finished equipment; it does not specifi-
cally refer to integrated circuits. The MAX3346E helps
to design equipment that meets Level 2 of IEC 1000-4-
2, without the need for additional ESD-protection com-
ponents.
The major difference between tests done using the
Human Body Model and IEC 1000-4-2 is a higher peak
current in IEC 1000-4-2, because series resistance is
lower in the IEC 1000-4-2 model. Hence, the ESD with-
stand voltage measured to IEC 1000-4-2 is generally
lower than that measured using the Human Body Model.
Figure 7a shows the IEC 1000-4-2 model.
The Air-Gap Discharge test involves approaching the
device with a charged probe. The Contact Discharge
method connects the probe to the device before the
probe is energized.
The Machine Model for ESD tests all pins using a 200pF
storage capacitor and zero discharge resistance. Its
objective is to emulate the stress caused by contact that
occurs with handling and assembly during manufactur-
ing. Of course, all pins require this protection during
manufacturing, not just USB inputs and outputs.
Therefore, after PC board assembly, the Machine Model
is less relevant to I/O ports.
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___________________________________________________________________________________________________
______________________________________________________________________________________
±15kV ESD-Protected USB Transceiver
Machine Model
IEC 1000-4-2
For the latest application details on UCSP construction,
dimensions, tape carrier information, printed circuit board
techniques, bump-pad layout, and recommended reflow
temperature profile as well as the latest information on
reliability testing results, go to the Maxim website at
www.maxim-ic.com/ucsp for the Application Note,
“UCSP—A Wafer-Level Chip-Scale Package.”
Figure 7a. IEC 1000-4-2 ESD Test Model
VOLTAGE
SOURCE
HIGH-
DC
UCSP Applications Information
CHARGE-CURRENT
LIMIT RESISTOR
50MΩ to 100MΩ
R
C
150pF
C s
STORAGE
CAPACITOR
RESISTANCE
DISCHARGE
330Ω
R
D
in UCSP
DEVICE
UNDER
TEST
13

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