MAX16046ETN+CK9 Maxim Integrated, MAX16046ETN+CK9 Datasheet - Page 55

• Manufacturer Part Number: MAX16046ETN+CK9
• Description: Supervisory Circuits 12Ch EEPROM Prob System Manager
• Manufacturer: Maxim Integrated
• Series: MAX16046, MAX16048r

Specifications of MAX16046ETN+CK9

• Rohs: yes

The TAP controller is a finite state machine that
responds to the logic level at TMS on the rising edge of
TCK. See Figure 14 for a diagram of the finite state
machine. The possible states are described below:
Test-Logic-Reset: At power-up, the TAP controller is in
the test-logic-reset state. The instruction register con-
tains the IDCODE instruction. All system logic of the
device operates normally. This state can be reached
from any state by driving TMS high for five clock cycles.
Run-Test/Idle: The run-test/idle state is used between
scan operations or during specific tests. The instruction
register and test data registers remain idle.
Figure 14. TAP Controller State Diagram
System Managers with Nonvolatile Fault Registers
1
0
TEST-LOGIC-RESET
RUN-TEST/IDLE
12-Channel/8-Channel EEPROM-Programmable
0
1
Controller State Machine
Test Access Port (TAP)
1
0
SELECT-DR-SCAN
1
CAPTURE-DR
UPDATE-DR
PAUSE-DR
SHIFT-DR
EXIT1-DR
EXIT2-DR
0
0
1
0
1
1
0
Select-DR-Scan: All test data registers retain their pre-
vious state. With TMS low, a rising edge of TCK moves
the controller into the capture-DR state and initiates a
scan sequence. TMS high during a rising edge on TCK
moves the controller to the select-IR-scan state.
Capture-DR: Data can be parallel-loaded into the test
data registers selected by the current instruction. If the
instruction does not call for a parallel load or the select-
ed test data register does not allow parallel loads, the
test data register remains at its current value. On the
rising edge of TCK, the controller goes to the shift-DR
state if TMS is low or it goes to the exit1-DR state if TMS
is high.
1
1
0
0
1
0
SELECT-IR-SCAN
1
CAPTURE-IR
UPDATE-IR
PAUSE-IR
EXIT1-IR
EXIT2-IR
SHIFT-IR
0
0
1
0
1
1
0
1
1
0
0
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