CY7C1061DV33-10ZSXI Cypress Semiconductor Corp, CY7C1061DV33-10ZSXI Datasheet - Page 8

IC SRAM 16MBIT 10NS 54TSOP

CY7C1061DV33-10ZSXI

Manufacturer Part Number
CY7C1061DV33-10ZSXI
Description
IC SRAM 16MBIT 10NS 54TSOP
Manufacturer
Cypress Semiconductor Corp
Type
Asynchronousr
Datasheet

Specifications of CY7C1061DV33-10ZSXI

Memory Size
16M (1M x 16)
Package / Case
54-TSOP II
Format - Memory
RAM
Memory Type
SRAM - Asynchronous
Speed
10ns
Interface
Parallel
Voltage - Supply
3 V ~ 3.6 V
Operating Temperature
-40°C ~ 85°C
Access Time
10 ns
Supply Voltage (max)
4.6 V
Supply Voltage (min)
2 V
Maximum Operating Current
175 mA
Organization
1 M x 16
Maximum Operating Temperature
+ 85 C
Minimum Operating Temperature
- 40 C
Mounting Style
SMD/SMT
Number Of Ports
1
Operating Supply Voltage
3.3 V
Density
16Mb
Access Time (max)
10ns
Sync/async
Asynchronous
Architecture
Not Required
Clock Freq (max)
Not RequiredMHz
Operating Supply Voltage (typ)
3.3V
Address Bus
20b
Package Type
TSOP-II
Operating Temp Range
-40C to 85C
Supply Current
175mA
Operating Supply Voltage (min)
3V
Operating Supply Voltage (max)
3.6V
Operating Temperature Classification
Industrial
Mounting
Surface Mount
Pin Count
54
Word Size
16b
Number Of Words
1M
Rohs Compliant
YES
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
428-2960-5
CY7C1061DV33-10ZSXI

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
CY7C1061DV33-10ZSXI
Manufacturer:
CYPRES21
Quantity:
76
Part Number:
CY7C1061DV33-10ZSXI
Manufacturer:
CYPRESS/赛普拉斯
Quantity:
20 000
AC Switching Characteristics
Over the Operating Range
Notes
Document Number: 38-05476 Rev. *G
Read Cycle
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
Write Cycle
t
t
t
t
t
t
t
t
t
t
t
8. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5 V, and input pulse levels of 0 to 3.0 V. Test conditions for the read cycle use
9. t
10. t
11. These parameters are guaranteed by design and are not tested.
12. The internal write time of the memory is defined by the overlap of WE, CE
13. The minimum write cycle time for Write Cycle No. 2 (WE controlled, OE LOW) is the sum of t
power
RC
AA
OHA
ACE
DOE
LZOE
HZOE
LZCE
HZCE
PU
PD
DBE
LZBE
HZBE
WC
SCE
AW
HA
SA
PWE
SD
HD
LZWE
HZWE
BW
output loading shown in part a) of
from steady state voltage.
to initiate a write, and the transition of any of these signals can terminate. The input data setup and hold timing should be referenced to the edge of the signal that
terminates the write.
POWER
HZOE
, t
Parameter
HZCE
gives the minimum amount of time that the power supply is at typical V
, t
[12, 13]
HZWE
, t
HZBE
, t
LZOE
[8]
, t
AC Test Loads and
V
Read Cycle Time
Address to Data Valid
Data Hold from Address Change
CE
OE LOW to Data Valid
OE LOW to Low Z
OE HIGH to High Z
CE
CE
CE
CE
Byte Enable to Data Valid
Byte Enable to Low Z
Byte Disable to High Z
Write Cycle Time
CE
Address Setup to Write End
Address Hold from Write End
Address Setup to Write Start
WE Pulse Width
Data Setup to Write End
Data Hold from Write End
WE HIGH to Low Z
WE LOW to High Z
Byte Enable to End of Write
LZCE
CC
1
1
1
1
1
1
, t
(Typical) to the First Access
LOW/CE
LOW/CE
HIGH/CE
LOW/CE
HIGH/CE
LOW/CE
LZWE
, and t
LZBE
Waveforms[7], unless specified otherwise.
2
2
2
2
2
2
HIGH to Data Valid
HIGH to Low Z
HIGH to Power Up
HIGH to Write End
LOW to High Z
LOW to Power Down
are specified with a load capacitance of 5 pF as in (b) of
[10]
[10]
[10]
Description
[10]
[10]
[9]
1
= V
[11]
IL
CC
, and CE
[11]
values until the first memory access is performed.
2
= V
IH
HZWE
. Chip enables must be active and WE and byte enables must be LOW
and t
AC Test Loads and
SD
.
Min
100
5.5
10
10
1
7
3
1
3
0
7
7
0
0
7
0
3
Waveforms[7]. Transition is measured 200 mV
–10
CY7C1061DV33
Max
10
10
10
5
5
5
5
5
5
Page 8 of 17
Unit
s
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
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