LH28F320S3NS-L11 Sharp Microelectronics, LH28F320S3NS-L11 Datasheet - Page 37
![IC FLASH 32MBIT 110NS 56SSOP](/photos/7/25/72534/lh28f320s3ns-l11_sml.jpg)
LH28F320S3NS-L11
Manufacturer Part Number
LH28F320S3NS-L11
Description
IC FLASH 32MBIT 110NS 56SSOP
Manufacturer
Sharp Microelectronics
Datasheet
1.LH28F320S3NS-L11.pdf
(62 pages)
Specifications of LH28F320S3NS-L11
Format - Memory
FLASH
Memory Type
FLASH
Memory Size
32M (4Mx8, 2Mx16)
Speed
110ns
Interface
Parallel
Voltage - Supply
3 V ~ 3.6 V
Operating Temperature
0°C ~ 70°C
Package / Case
56-SSOP
Lead Free Status / RoHS Status
Contains lead / Request inventory verification
Other names
425-1844
LHF32K01
LHF32K01
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
LH28F320S3NS-L11
Manufacturer:
SHARP
Quantity:
5 380
Company:
Part Number:
LH28F320S3NS-L11
Manufacturer:
SHARP
Quantity:
5 380
Part Number:
LH28F320S3NS-L11
Manufacturer:
SHARP
Quantity:
20 000
sharp
6.2.2 AC INPUT/OUTPUT TEST CONDITIONS
Figure 16. Transient Equivalent Testing
DEVICE
UNDER
TEST
Input rise and fall times (10% to 90%) <10 ns.
Input rise and fall times (10% to 90%) <10 ns.
AC test inputs are driven at 2.7V for a Logic "1" and 0.0V for a Logic "0." Input timing begins, and output timing ends, at 1.35V.
AC test inputs are driven at 3.0V for a Logic "1" and 0.0V for a Logic "0." Input timing begins, and output timing ends, at 1.5V.
2.7
0.0
3.0
0.0
C
L
Capacitance
Includes Jig
Figure 15. Transient Input/Output Reference Waveform for V
Figure 14. Transient Input/Output Reference Waveform for V
Load Circuit
INPUT
INPUT
1.3V
R
C
L
1N914
=3.3kΩ
L
1.35
1.5
OUT
LHF32K01
TEST POINTS
TEST POINTS
Test Configuration Capacitance Loading Value
V
CC
Test Configuration
=3.3V±0.3V, 2.7V-3.6V
CC
CC
=3.3V±0.3V
=2.7V-3.6V
1.35
1.5
OUTPUT
OUTPUT
C
L
50
(pF)
Rev. 1.6
34