EVAL-AD7694SDZ Analog Devices, EVAL-AD7694SDZ Datasheet - Page 6

• Manufacturer Part Number: EVAL-AD7694SDZ
• Description: Data Conversion IC Development Tools EVALUATION BOARD
• Manufacturer: Analog Devices
• Type: ADCr
• Series: AD7694r

Specifications of EVAL-AD7694SDZ

• Rohs: yes
• Product: Evaluation Boards
• Tool Is For Evaluation Of: AD7694
• Interface Type: SPI
• Operating Supply Voltage: 2.7 V to 5.25 V
• Maximum Operating Temperature: + 85 C
• Minimum Operating Temperature: - 40 C
• Factory Pack Quantity: 1

AD7694
ABSOLUTE MAXIMUM RATINGS
Table 6.
Parameter
Analog Inputs
Supply Voltages
1
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
See the Analog Input section.
IN+
REF
VDD to GND
Digital Inputs to GND
Digital Outputs to GND
Storage Temperature Range
Junction Temperature
θ
θ
Lead Temperature Range
JA
JC
Vapor Phase (60 sec)
Infrared (15 sec)
Thermal Impedance
Thermal Impedance
1
, IN−
1
Rating
GND − 0.3 V to VDD + 0.3 V
GND − 0.3 V to VDD + 0.3 V
−0.3 V to +7 V
−0.3 V to VDD + 0.3 V
−0.3 V to VDD + 0.3 V
−65°C to +150°C
150°C
200°C/W (MSOP-8)
44°C/W (MSOP-8)
215°C
220°C
or ±130 mA
t
DELAY
V
IL
Figure 2. Load Circuit for Digital Interface Timing
Figure 3. Voltage Reference Levels for Timing
TO SDO
V
V
OH
50pF
OL
Rev. A | Page 6 of 16
C
L
500μA
500μA
I
I
OL
OH
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
V
IH
t
DELAY
V
V
1.4V
OH
OL