SST25VF040B-50-4I-QAF Microchip Technology, SST25VF040B-50-4I-QAF Datasheet - Page 28

• Manufacturer Part Number: SST25VF040B-50-4I-QAF
• Description: IC FLASH SER 4MB 50MHZ SPI 8WSON
• Manufacturer: Microchip Technology

Specifications of SST25VF040B-50-4I-QAF

• Memory Type: FLASH
• Memory Size: 4M (512K x 8)
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 8-WSON
• Format - Memory: FLASH
• Speed: 50MHz
• Interface: SPI Serial
• Voltage - Supply: 2.7 V ~ 3.6 V
• Architecture: Sectored
• Interface Type: SPI
• Access Time: 50 ns
• Supply Voltage (max): 3.6 V
• Supply Voltage (min): 2.7 V
• Maximum Operating Current: 15 mA
• Mounting Style: SMD/SMT
• Organization: 32 KB
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Lead free / RoHS Compliant

A Microchip Technology Company
©2011 Silicon Storage Technology, Inc.
Figure 26:AC Input/Output Reference Waveforms
Figure 27:A Test Load Example
AC test inputs are driven at V
ment reference points for inputs and outputs are V
times (10%
V IHT
V ILT
↔
90%) are <5 ns.
INPUT
TO DUT
IHT
(0.9V
V HT
V LT
DD
28
) for a logic “1” and V
REFERENCE POINTS
HT
TO TESTER
(0.6V
4 Mbit SPI Serial Flash
DD
) and V
ILT
(0.1V
V HT
V LT
1295 TstLd.0
LT
DD
(0.4V
C
L
) for a logic “0”. Measure-
Note: V
DD
SST25VF040B
OUTPUT
). Input rise and fall
V
V
V
LT
IHT
ILT
HT
- V
- V
- V
- V
S71295-06-000
LOW
HIGH
INPUT
INPUT
1295 IORef.0
Test
Test
Data Sheet
LOW Test
HIGH Test
02/11