CAT28F020L12 ON Semiconductor, CAT28F020L12 Datasheet - Page 3

• Manufacturer Part Number: CAT28F020L12
• Description: IC FLASH 2MBIT 120NS 32DIP
• Manufacturer: ON Semiconductor

Specifications of CAT28F020L12

• Format - Memory: FLASH
• Memory Type: FLASH
• Memory Size: 2M (256K x 8)
• Speed: 120ns
• Interface: Parallel
• Voltage - Supply: 4.5 V ~ 5.5 V
• Operating Temperature: 0°C ~ 70°C
• Package / Case: 32-DIP (0.600", 15.24mm)
• Data Bus Width: 8 bit
• Architecture: Non Sectored
• Interface Type: Parallel
• Supply Voltage (max): 5.5 V
• Supply Voltage (min): 4.5 V
• Maximum Operating Current: 30 mA
• Mounting Style: Through Hole
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: CAT28F020L-12; CAT28F020L-12

RELIABILITY CHARACTERISTICS
ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias ................. –45 C to +130 C
Storage Temperature ....................... –65 C to +150 C
Voltage on Any Pin with
Voltage on Pin A
V
V
Package Power Dissipation
Lead Soldering Temperature (10 secs) ............ 300 C
Output Short Circuit Current
CAPACITANCE T
Note:
1. The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
2. Output shorted for no more than one second. No more than one output shorted at a time.
3. This parameter is tested initially and after a design or process change that affects the parameter.
4. Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V
© 2009 SCILLC. All rights reserved.
Characteristics subject to change without notice
PP
CC
Symbol
I
Symbol
N
V
C
LTH
C
Respect to Ground
Respect to Ground
during Program/Erase
Capability (T
voltage on output pins is V
T
C
with Respect to Ground
with Respect to Ground
END
ZAP
OUT
VPP
DR
IN
(3)(4)
(3)
(3)
(3)
(3)
(3)
(3)
ESD Susceptibility
A
V
Output Pin Capacitance
9
Data Retention
Input Pin Capacitance
PP
= 25 C) .................................. 1.0 W
with
A
Parameter
Endurance
Latch-Up
Supply Capacitance
= 25 C, f = 1.0 MHz
(1)
(1)
CC
........... –2.0V to +V
................... –2.0V to +13.5V
(1)
Test
+0.5V, which may overshoot to V
.............. –2.0V to +14.0V
(1)
(2)
............ –2.0V to +7.0V
........................ 100 mA
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
CC
Test Method
+ 2.0V
Conditions
V
V
V
CC
OUT
PP
IN
3
+ 2.0V for periods of less than 20ns.
= 0V
= 0V
= 0V
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of
the device at these or any other conditions outside of those
listed in the operational sections of this specification is not
implied. Exposure to any absolute maximum rating for
extended periods may affect device performance and
reliability.
100K
2000
Min
100
Min
10
CC
+1V.
Typ
Typ
Max
Max
10
25
6
Doc. No. MD-1029, Rev. F
CAT28F020
Cycles/Byte
Units
Years
Units
Volts
mA
pF
pF
pF