AT25256W-10SC Atmel, AT25256W-10SC Datasheet - Page 2

• Manufacturer Part Number: AT25256W-10SC
• Description: IC EEPROM 256KBIT 3MHZ 8SOIC
• Manufacturer: Atmel

Specifications of AT25256W-10SC

• Format - Memory: EEPROMs - Serial
• Memory Type: EEPROM
• Memory Size: 256K (32K x 8)
• Speed: 3MHz
• Interface: SPI, 3-Wire Serial
• Voltage - Supply: 4.5 V ~ 5.5 V
• Operating Temperature: 0°C ~ 70°C
• Package / Case: 8-SOIC (5.3mm Width), 8-SOP, 8-SOEIAJ
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

Absolute Maximum Ratings*
Figure 1. Block Diagram
2
Operating Temperature..................................–55°C to +125°C
Storage Temperature .....................................–65°C to +150°C
Voltage on Any Pin
with Respect to Ground .................................... –1.0V to +7.0V
Maximum Operating Voltage .......................................... 6.25V
DC Output Current........................................................ 5.0 mA
AT25128/256
The AT25128/256 is enabled through the Chip Select pin (CS) and accessed via a 3-
wire interface consisting of Serial Data Input (SI), Serial Data Output (SO), and Serial
Clock (SCK). All programming cycles are completely self-timed, and no separate Erase
cycle is required before Write.
Block Write protection is enabled by programming the status register with top ¼, top ½
or entire array of write protection. Separate Program Enable and Program Disable
instructions are provided for additional data protection. Hardware data protection is pro-
vided via the WP pin to protect against inadvertent write attempts to the status register.
The HOLD pin may be used to suspend any serial communication without resetting the
serial sequence.
16384/32768 x 8
*NOTICE:
Stresses beyond those listed under “Absolute Maxi-
mum Ratings” may cause permanent damage to the
device. This is a stress rating only and functional
operation of the device at these or any other condi-
tions beyond those indicated in the operational sec-
tions of this specification is not implied. Exposure to
absolute maximum rating conditions for extended
periods may affect device reliability.
0872O–SEEPR–03/05