AT17LV010-10PC Atmel, AT17LV010-10PC Datasheet - Page 10

IC SRL CONFIG EEPROM 1M LV 8DIP

AT17LV010-10PC

Manufacturer Part Number
AT17LV010-10PC
Description
IC SRL CONFIG EEPROM 1M LV 8DIP
Manufacturer
Atmel
Datasheets

Specifications of AT17LV010-10PC

Programmable Type
Serial EEPROM
Memory Size
1Mb
Voltage - Supply
3 V ~ 3.6 V, 4.75 V ~ 5.25 V
Operating Temperature
0°C ~ 70°C
Package / Case
8-DIP (0.300", 7.62mm)
Current, Input, Leakage
±10 μA
Current, Operating
5 mA
Current, Output, Leakage
±10
Data Retention
90 yrs.
Density
1M
Interface
2-Wire
Memory Type
Serial EEPROM
Organization
1048576×1
Package Type
PDIP
Temperature, Operating
0 to +70 °C
Time, Address Setup
20
Time, Fall
20 ns
Time, Rise
20 ns
Voltage, Esd
2000 V
Voltage, Input, High
5.25 V
Voltage, Input, Low
0.8 V
Voltage, Output, High
3.86 V
Voltage, Output, Low
0.32 V
Voltage, Supply
4.75 to 5.25 V
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
AT17LV010-10PC
Manufacturer:
AD
Quantity:
3 014
11. Absolute Maximum Ratings*
12. Operating Conditions
10
Operating Temperature................................... -40° C to +85° C
Storage Temperature .................................... -65° C to +150° C
Voltage on Any Pin
with Respect to Ground ..............................-0.1V to V
Supply Voltage (V
Maximum Soldering Temp. (10 sec. @ 1/16 in.)............ 260° C
ESD (R
Symbol
V
CC
ZAP
AT17LV65/128/256/512/010/002/040
= 1.5K, C
Description
Commercial
Industrial
CC
) .........................................-0.5V to +7.0V
ZAP
= 100 pF)................................. 2000V
Supply voltage relative to GND
-0° C to +70° C
Supply voltage relative to GND
-40° C to +85° C
CC
+0.5V
*NOTICE:
Min
3.0
3.0
3.3V
Stresses beyond those listed under Absolute
Maximum Ratings may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those listed under oper-
ating conditions is not implied. Exposure to Abso-
lute Maximum Rating conditions for extended
periods of time may affect device reliability.
Max
3.6
3.6
4.75
Min
4.5
5V
Max
5.25
5.5
2321I–CNFG–2/08
Units
V
V

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