FAN1655MTFX Fairchild Semiconductor, FAN1655MTFX Datasheet
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FAN1655MTFX
Specifications of FAN1655MTFX
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FAN1655MTFX Summary of contents
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... This notification is for your information and concurrence. This is a preliminary notification. A Final PCN will be issued when qualification is complete and data is available. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. If you have any questions concerning this change, please contact: ...
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... Change From Change To Qualification Stress Test and Sample Size Detail Device #1 FAN1655MTFX Package: NMTF0 #Leads: 016 Precondition Description: Stress P/C Standard PCNL1A JESD22-A113 Environment Stress Detail: Stress P/C Standard DOPL JESD22-A108 125C, 0V HAST2 X JESD22-A110 85%RH, 110C, HTSL X JESD22-A103 150C TMCL1 X JESD22-A104 125C, 0C ...
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... TP2 1 1 168 1000 168 1000 1000 500 Conditions Readpoints Conditions TP1 TP2 1 1 168 1000 168 1000 1000 500 74VCX16722MTDX FAN5019MTCX FAN5232MTC FAN5236MTCX GTLP16T1655MTD SSTV16859MTDX Read- Sample points A 0 Samples Read- Sample points A 0 Samples FAN1655MTFX FAN5026MTC FAN5232MTCX FAN5240MTC GTLP16T1655MTDX Pg. 3 ...