FAN1851AN Fairchild Semiconductor, FAN1851AN Datasheet
FAN1851AN
Manufacturer Part Number
FAN1851AN
Description
IC CTRLR AC GRND FAULT 8DIP
Manufacturer
Fairchild Semiconductor
Datasheet
1.FAN1851AN.pdf
(11 pages)
Specifications of FAN1851AN
Applications
*
Mounting Type
Through Hole
Package / Case
8-DIP (0.300", 7.62mm)
Product
Voltage References
Mounting Style
Through Hole
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
FAN1851AN
Manufacturer:
MICROCHIP
Quantity:
2
This is to inform you that a design and/or process change will be made to the following
product(s). This notification is for your information and concurrence.
If you require data or samples to qualify this change, please contact Fairchild Semiconductor
within 30 days of receipt of this notification.
Updated process quality documentation, such as FMEAs and Control Plans, are available for
viewing upon request.
If you have any questions concerning this change, please contact:
PCN Originator:
Name: Lim, TengLi
E-mail: TengLi.Lim@notes.fairchildsemi.com
Phone: 604 6437 211 ext 2276
Implementation of change:
Expected 1st Device Shipment Date: 2008/11/20
Earliest Year/Work Week of Changed Product: 0807
Change Type Description: Mold Compound
Description of Change (From): PDIP package assembly at UTAC using non Green mold
compound.
Description of Change (To): PDIP package assembly at UTAC using Green mold compound.
Reason for Change : Green initiative by Fairchild Semiconductor. Fairchild Semiconductor is
dedicated to being a good corporate citizen. All Fairchild Semiconductor products are 2nd level
interconnect lead-free and RoHS compliance. The referenced material changes have been made
to provide a ?Full Green? (Halogen Free Flame Retardant) package.
Qual/REL Plan Numbers : Q20070425
Qualification :
Qualification Plan Results are as stated in the Qualification Plan # Q20070425.
Results/Discussion for Qual Plan NumberQ20070425
Test: (Gate Leakage Negative)
Lot
Q20070425AAGATE-
Q20070425BAGATE-
Q20070425CAGATE-
Test: (Gate Leakage Positive)
Lot
DESIGN/PROCESS CHANGE NOTIFICATION -- FINAL
Technical Contact:
Name: Choong, CH
E-mail: ch.choong@fairchildsemi.com
Phone:
Device
RV4145AN
FAN2502S25X
MM74C926N
Device
Results
0/3
0/3
0/3
Results
Date Issued On : 2008/09/05
Date Created : 2008/08/22
Failure Code
Failure Code
PCN# : Q3083404
Pg. 1
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FAN1851AN Summary of contents
Page 1
... This is to inform you that a design and/or process change will be made to the following product(s). This notification is for your information and concurrence. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. Updated process quality documentation, such as FMEAs and Control Plans, are available for viewing upon request ...
Page 2
... RV4145AN Q20070425BAHAST1 FAN2502S25X Test: MSL(1), PKG(Small), PeakTemp(260c), Cycles(3) (Precondition) Lot Device Q20070425AAPCNL1A RV4145AN Q20070425BAPCNL1A FAN2502S25X Q20070425CAPCNL1A MM74C926N Product Id Description : UTAC 8L & 18L PDIP Green EMC. Affected FSIDs : FAN1851AN RA9100_32 RV4145AN_F091 0/3 0/3 0/3 168-HOURS 1000-HOURS 0/77 0/77 0/77 0/77 0/77 0/77 ...