TLP127(TPL,U,F) Toshiba, TLP127(TPL,U,F) Datasheet - Page 62
![PHOTOCOUPLER DARL-OUT 4-SMD](/photos/7/69/76954/264-4-mfsop_sml.jpg)
TLP127(TPL,U,F)
Manufacturer Part Number
TLP127(TPL,U,F)
Description
PHOTOCOUPLER DARL-OUT 4-SMD
Manufacturer
Toshiba
Specifications of TLP127(TPL,U,F)
Number Of Channels
1
Input Type
DC
Voltage - Isolation
2500Vrms
Current Transfer Ratio (min)
1000% @ 1mA
Voltage - Output
300V
Current - Output / Channel
150mA
Current - Dc Forward (if)
50mA
Vce Saturation (max)
1.2V
Output Type
Darlington
Mounting Type
Surface Mount
Package / Case
4-SMD
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Current Transfer Ratio (max)
-
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
TLP127(TPL,U,F)
Manufacturer:
TI
Quantity:
11 450
Part Number:
TLP127(TPL,U,F)
Manufacturer:
TOSHIBA/东芝
Quantity:
20 000
Part Number:
TLP127(TPL,U,F)/CT127(T1)
Manufacturer:
TOSHIBA/东芝
Quantity:
20 000
9
The above operating life data are estimates extrapolated from long-term light output degradation over a single wafer lot and are
shown as reference only. Operating conditions exceeding the maximum ratings are not guaranteed.
3
3
10000000
1000000
GaA As (DH) LED Projected Light Output Degradation Data
GaA As (DH) LED Projected Operating Life Data
140
120
100
140
120
100
Device Degradation
100000
80
60
40
20
80
60
40
20
10000
0
0
1000
1
1
100
227
2.0
I
I
I
I
I
Failure criteria light output degradation Δ P O < –50%
F
F
F
F
F
150
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
10
Test conditions: I
Test conditions: I
100
85
3.0
60
100
100
Test time (h)
Test time (h)
F
F
25
= 50 mA, Ta = 40°C
= 10 mA, Ta = 40°C
1000
1000
0
4.0
I
F
Ambient Temperature (°C)
= 10 mA
I
I
I
I
–30
F
F
F
F
= 20 mA
= 30 mA
= 40 mA
= 50 mA
Projected F50%
operating life
10000
10000
Projected F0.1%
operating life
X-3σ
–50
X-3σ
1 / K(×10
X
X
100000
100000
–73
5.0
−3
)
62
10000000
1000000
140
120
100
100000
80
60
40
20
10000
0
1000
100
1
227
2.0
I
I
I
I
I
150
F
F
F
F
F
Failure criteria light output degradation Δ P O < –30%
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
Test conditions: I
100
85
3.0
60
100
Test time (h)
F
25
= 20 mA, Ta = 40°C
1000
0
4.0
Ambient Temperature (°C)
I
I
I
I
I
F
F
F
F
F
–30
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
Projected F0.1%
operating life
Projected F50%
operating life
10000
X-3σ
–50
X
1 / K(×10
100000
–73
5.0
−3
)