TLP161J(TPR,U,C,F) Toshiba, TLP161J(TPR,U,C,F) Datasheet - Page 61

• Manufacturer Part Number: TLP161J(TPR,U,C,F)
• Description: PHOTOCOUPLER TRIAC-OUT 4-SMD
• Manufacturer: Toshiba

Specifications of TLP161J(TPR,U,C,F)

• Voltage - Isolation: 2500Vrms
• Number Of Channels: 1
• Voltage - Off State: 600V
• Output Type: AC, Triac, Standard
• Current - Gate Trigger (igt) (max): 10mA
• Current - Hold (ih): 600µA
• Current - Dc Forward (if): 50mA
• Current - Output / Channel: 70mA
• Mounting Type: Surface Mount
• Package / Case: 4-SMD
• Output Device: PhotoTriac
• Isolation Voltage: 2500 Vrms
• Maximum Input Voltage: 1.3 V
• Maximum Output Voltage: 600 V
• Maximum Continuous Output Current: 70 mA
• Maximum Input Current: 50 mA
• Maximum Operating Temperature: + 100 C
• Maximum Reverse Diode Voltage: 5 V
• Minimum Operating Temperature: - 40 C
• Mounting Style: SMD/SMT
• Typical Input Voltage: 1.15 V
• Zero-crossing Circuit: Yes
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: TLP161JFTR

The above operating life data are estimates extrapolated from long-term light output degradation over a single wafer lot and are
shown as reference only. Operating conditions exceeding the maximum ratings are not guaranteed.
2
2
10000000
1000000
100000
140
120
100
140
120
100
10000
GaA As (SH) LED Projected Operating Life Data
GaA As (SH) LED Projected Light Output Degradation Data
80
60
40
20
80
60
40
20
1000
0
0
100
1
1
227
2.0
I
I
I
I
I
Failure criteria light output degradation Δ P O < –50%
150
F
F
F
F
F
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
10
100
Test conditions: I
Test conditions: I
85
3.0
60
100
100
Test time (h)
Test time (h)
25
F
F
= 50 mA, Ta = 40°C
= 10 mA, Ta = 40°C
0
1000
1000
4.0
I
I
I
I
I
F
F
F
F
F
–30
Ambient Temperature (°C)
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
X-3σ
Projected F50%
operating life
Projected F0.1%
operating life
10000
10000
–50
X-3σ
1 / K (x10
X
X
–73
100000
100000
5.0
-3
)
61
10000000
1000000
100000
140
120
100
10000
80
60
40
20
1000
0
100
1
227
2.0
Failure criteria light output degradation Δ P O < –30%
I
I
I
I
I
150
F
F
F
F
F
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
100
Test conditions: I
85
3.0
60
100
Test time (h)
25
F
= 20 mA, Ta = 40°C
1000
0
4.0
I
I
I
I
I
–30
F
F
F
F
F
Ambient Temperature (°C)
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
Projected F0.1%
operating life
Projected F50%
operating life
10000
X-3σ
–50
1 / K (x10
X
–73
100000
5.0
-3
)