CLINK3V28BT-85 National Semiconductor, CLINK3V28BT-85 Datasheet - Page 16

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CLINK3V28BT-85

Manufacturer Part Number
CLINK3V28BT-85
Description
KIT EVAL 28BIT DS90CR287/288A
Manufacturer
National Semiconductor
Datasheets

Specifications of CLINK3V28BT-85

Main Purpose
Interface, Serializer, Deserializer (SERDES)
Utilized Ic / Part
DS90CR287, DS90CR288A
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Secondary Attributes
-
Embedded
-
Primary Attributes
-
Typical Connection / Test Equipment
The following is a list of typical test equipment that may be used to generate signals
for the TX inputs:
1) TEK HFS9009 - This pattern generator along with 9DG2 Cards may be used to
2) TEK DG2020 - This generator may also be used to generate data and clock
3) TEK MB100 BERT - This bit error rate tester may be used for both signal source
4) Any other signal / pattern generator that generates the correct input levels as
The following is a list of typically test equipment that may be used to monitor the
output signals from the RX:
1) TEK MB100 BERT - Receiver.
2) Any SCOPE with 50 Ohm inputs or high impedance probes.
LVDS signals may be easily measured with high impedance / high bandwidth
differential probes such as the TEK P6247 or P6248 differential probes.
The picture below shows a typical test set up using a generator and scope.
Signal/Pattern Generator,
generate input signals and also the clock signal.
signals.
and receiver.
specified in the datasheet.
BERT Tester
50 ohm
Typical Connection / Test Equipment Setup
50 ohm
National Semiconductor Corporation
Channel Link Evaluation Kit User Manual
Transmitter
Board
Optional
Termination
LVDS Interface
Cable
Interface Products
Receiver
Board
Optional
Termination
450 ohm
50 ohm
LIT# CLINK3V28BT-85-UM
Rev 2.1
Date: 10/12/2005
Page 16 of 28
50 ohm
Oscilloscope,
BERT Tester

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