AS1110 EB austriamicrosystems, AS1110 EB Datasheet - Page 17

• Manufacturer Part Number: AS1110 EB
• Description: BOARD EVAL AS1110
• Manufacturer: austriamicrosystems

Specifications of AS1110 EB

• Current - Output / Channel: 0.5 ~ 100 mA
• Outputs And Type: 16, Non-Isolated
• Voltage - Output: 0 ~ 15 V
• Features: Over-Temperature, Open-LED, Shorted-LED, Diagnostics
• Voltage - Input: 3 ~ 5.5 V
• Utilized Ic / Part: AS1110
• Lead Free Status / RoHS Status: Lead free by exemption / RoHS compliant by exemption

AS1110
Datasheet - A p p l i c a t i o n I n f o r m a t i o n
9 Application Information
Error Detection
The AS1110 features two types of error detection. The error detection can be used on-the-fly, for active LEDs, without
any delay, or by entering into low-current diagnosis mode.
Error Detection On-The-Fly
Error detection on-the-fly will output the status of active LEDs during operation. Without choosing an error mode this
will output the temperature flag at every input/output cycle. Triggering one clock pulse for open or two clock pulses for
short detection during error detection mode outputs the detailed open- or short-error report with the next input/output
cycle
Figure 19. Normal Operation with Error Detection During Operation – 64 Cascaded AS1110s
Error Detection with Low-Current Diagnosis Mode
This unique feature of the AS1110 uses an internal all 1s test pattern for a flicker free diagnosis of all LEDs. This error
detection mode can be started at the end of each input cycle
Figure 20. Low-Current Diagnosis Mode with Internal All 1s Test Pattern – 64 Cascaded AS1110s
www.austriamicrosystems.com/LED-Driver-ICs/AS1110
Display
Current
Current
Display
SDO
OEN
SDO
OEN
CLK
CLK
SDI
(see Figure
SDI
LD
LD
T/O or S Error Code
Acquisition of Error Status
T/O or S Error Code
19). LEDs turned off at test time are not tested and will show a logic "1" at the detailed error report.
Acquisition of Error Status
Rising Edge of OEN
Data0
Data1
Data0
1024x
Data2
1024x
≤ 100mA
Data1
Data0
Rising Edge of OEN
3x Clocks Low-
Current Mode
Clock for Error
Mode 0x/1x/2x
Use Internal All 1s
Test Pattern
GEF
≤ 0.8mA
Clock for Error
Mode 1x/2x
Falling Edge of LD; Error Register is
copied into Shift Register
GEF
Low-Current Diagnosis Mode
T/O or S Error Code
Falling Edge of LD; Error Register
is copied into Shift Register
Revision 1.05
Acquisition of Error Status
O or S Error Code from
All 1s Test Pattern
Data1
≤ 100mA
1024x
Data2
Data3
Rising Edge of OEN
(see Figure
GEF
1024x
Data1
Data2
Mode 0x/1x/2x
Clock for Error
20).
≤ 100mA
GEF
GEF
Falling Edge of LD; Error Register is
copied into Shift Register
GEF = Global Error Flag
T/O or S Error Code
Temperature Error Code
GEF = Global Error Flag
Data2
Data3
1024x
Data4
1024x
Data2
Data3
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