PIC16F690DM-PCTLHS Microchip Technology, PIC16F690DM-PCTLHS Datasheet - Page 4

BOARD DEMO PICTAIL HUMIDITY SNSR

PIC16F690DM-PCTLHS

Manufacturer Part Number
PIC16F690DM-PCTLHS
Description
BOARD DEMO PICTAIL HUMIDITY SNSR
Manufacturer
Microchip Technology
Series
PICtail™r

Specifications of PIC16F690DM-PCTLHS

Sensor Type
Humidity
Sensing Range
1 ~ 99% RH
Interface
Analog
Voltage - Supply
5V
Embedded
Yes, MCU, 8-Bit
Utilized Ic / Part
MCP6291, PIC16F690
Processor To Be Evaluated
MCP6291 and PIC16F690
Interface Type
ICSP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
For Use With
AC162061 - HEADER INTRFC MPLAB ICD2 20PIN
Sensitivity
-
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
MCP6291/1R/2/3/4/5
TEMPERATURE SPECIFICATIONS
FIGURE 1-1:
Chip Select (CS) pin on the MCP6293 and
MCP6295.
DS21812E-page 4
Electrical Characteristics: Unless otherwise indicated, V
Temperature Ranges
Operating Temperature Range
Storage Temperature Range
Thermal Package Resistances
Thermal Resistance, 5L-SOT-23
Thermal Resistance, 6L-SOT-23
Thermal Resistance, 8L-PDIP
Thermal Resistance, 8L-SOIC
Thermal Resistance, 8L-MSOP
Thermal Resistance, 14L-PDIP
Thermal Resistance, 14L-SOIC
Thermal Resistance, 14L-TSSOP
CS
V
I
I
SS
CS
Note:
OUT
-0.7 µA
(typical)
0.7 µA
(typical)
Hi-Z
The Junction Temperature (T
Parameters
V
t
IL
ON
Timing Diagram for the
-1.0 mA
(typical)
10 nA
(typical)
J
) must not exceed the Absolute Maximum specification of +150°C.
V
0.7 µA
(typical)
IH
t
-0.7 µA
(typical)
OFF
Sym
θ
θ
θ
θ
θ
θ
θ
θ
T
T
Hi-Z
JA
JA
JA
JA
JA
JA
JA
JA
A
A
DD
= +2.4V to +5.5V and V
Min
-40
-65
1.1
The test circuits used for the DC and AC tests are
shown in
capacitors are laid out according to the rules discussed
in Section 4.6 “Supply Bypass”.
FIGURE 1-2:
Most Non-Inverting Gain Conditions.
FIGURE 1-3:
Most Inverting Gain Conditions.
V
V
V
V
DD
DD
Typ
256
230
163
206
120
100
85
70
IN
IN
/2
/2
Test Circuits
R
R
R
R
N
G
N
G
Figure 1-2
SS
+125
+150
Max
= GND.
MCP629X
MCP629X
V
V
AC and DC Test Circuit for
AC and DC Test Circuit for
DD
DD
Units
and
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
© 2007 Microchip Technology Inc.
°C
°C
0.1 µF
0.1 µF
R
R
Figure
F
F
Note
1 µF
1 µF
1-2. The bypass
Conditions
C
C
L
L
V
V
L
L
V
R
V
R
OUT
OUT
L
L

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