EVAL-AD8332/AD9238 Analog Devices Inc, EVAL-AD8332/AD9238 Datasheet - Page 20

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EVAL-AD8332/AD9238

Manufacturer Part Number
EVAL-AD8332/AD9238
Description
BOARD EVALUATION AD8332/AD9238
Manufacturer
Analog Devices Inc
Datasheet

Specifications of EVAL-AD8332/AD9238

Module/board Type
Evaluation Board
For Use With/related Products
AD8332, AD9238
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
AD8331/AD8332/AD8334
TEST CIRCUITS
MEASUREMENT CONSIDERATIONS
Figure 55 through Figure 68 show typical measurement
configurations and proper interface values for measurements
with 50 Ω conditions.
Short-circuit input noise measurements are made as shown in
Figure 62. The input-referred noise level is determined by
Figure 56. Test Circuit—Frequency Response for Various Matched Source Impedances
Figure 57. Test Circuit—Frequency Response for Unterminated LNA, R
Figure 55. Test Circuit—Gain and Bandwidth Measurements
*FERRITE BEAD
10kΩ
*FERRITE BEAD
*FERRITE BEAD
120nH
120nH
FB*
FB*
22pF
120nH
22pF
FB*
22pF
OUT
OUT
0.1µF
OUT
0.1µF
0.1µF
50Ω
NETWORK ANALYZER
NETWORK ANALYZER
50Ω
18nF
0.1µF
Rev. G | Page 20 of 56
NETWORK ANALYZER
50Ω
18nF
0.1µF
INH
INH
LMD
LMD
INH
270Ω
LMD
10kΩ
0.1µF
DUT
DUT
VGN
DUT
0.1µF
0.1µF
0.1µF
50Ω
50Ω
0.1µF
VGN
0.1µF
dividing the output noise by the numerical gain between Point A
and Point B and accounting for the noise floor of the spectrum
analyzer. The gain should be measured at each frequency of
interest and with low signal levels because a 50 Ω load is driven
directly. The generator is removed when noise measurements
are made.
50Ω
0.1µF
IN
IN
237Ω
237Ω
237Ω
237Ω
IN
237Ω
237Ω
28Ω
28Ω
28Ω
28Ω
28Ω
28Ω
1:1
1:1
1:1
S
= 50 Ω

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