DEA1X3D100JC1B Murata Electronics North America, DEA1X3D100JC1B Datasheet - Page 40

CAP CER DISC 10PF 2KV SL RAD

DEA1X3D100JC1B

Manufacturer Part Number
DEA1X3D100JC1B
Description
CAP CER DISC 10PF 2KV SL RAD
Manufacturer
Murata Electronics North America
Series
DEAr
Datasheets

Specifications of DEA1X3D100JC1B

Capacitance
10pF
Voltage - Rated
2000V (2kV)
Tolerance
±5%
Temperature Coefficient
SL
Mounting Type
Through Hole
Operating Temperature
20°C ~ 85°C
Features
High Voltage
Applications
General Purpose
Package / Case
Radial - Disc
Size / Dimension
0.177" Dia (4.5mm)
Thickness
5.00mm Max
Lead Spacing
0.197" (5.00mm)
Lead Style
Straight
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Ratings
-
Other names
490-4167
DEA1X3D100JA1B
7
!Note
• This PDF catalog is downloaded from the website of Murata Manufacturing co., ltd. Therefore, it’s specifications are subject to change or our products in it may be discontinued without advance notice. Please check with our
• This PDF catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
sales representatives or product engineers before ordering.
!Note
38
No.
16
17 Life
*
*
*
DEH Series Specifications and Test Methods
1
2
3
"room condition" Temperature: 15 to 35°C, Relative humidity: 45 to 75%, Atmospheric pressure: 86 to 106kPa
The measurement of I.R. will be held in 1 to 2 hrs. after Humidity loading test.
The measurement of I.R. will be held in 12 to 24 hrs. after Life test.
Continued from the preceding page.
Humidity
Loading
• Please read rating and !CAUTION (for storage, operating, rating, soldering, mounting and handling) in this catalog to prevent smoking and/or burning, etc.
• This catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
Item
Appearance
Capacitance
Change
D.F.
I.R.
Appearance
Capacitance
Change
D.F.
I.R.
No marked defect
Within ±10%
0.6% max.
1000MΩ min.
No marked defect
Within ±10%
0.4% max.
Char. R [DC1 to 3.15kV], Char. C
Char. R [DC250V]: 1000MΩ min.
Specifications
: 2000MΩ min.
Apply the rated voltage for 500+24/-0 hrs. at 40±2°C in 90 to
95% relative humidity. (Charge/Discharge currentV50mA)
Pre-treatment:
Post-treatment:
Post-treatment:
Measurement order:
Apply a DC voltage of 200% of the rated voltage (DC250V,
DC500V) or DC voltage of 150% of the rated voltage (DC1 to
3.15kV) for 1000 +48/-0 hrs. at 125±2°C with a relative
humidity of 50% max.
(Charge/Discharge currentV50mA)
Pre-treatment:
Post-treatment:
Measurement order:
Capacitor should be stored at 125±3°C for 1 hr., then placed at
room condition*
Capacitor should be stored for 1 to 2 hrs. at room condition*
(Char. R [DC1 to 3.15kV], Char. C)
Capacitor should be stored at 125±3°C for 1 hr., then placed
at room condition*
I.R. -> Pre-treatment -> Capacitance
Humidity loading test -> I.R.*
Capacitance
Capacitor should be stored at 125±3°C for 1 hr., then placed
at room condition*
Capacitor should be stored at 125±3°C for 1 hr., then placed
at room condition*
I.R. -> Pre-treatment -> Capacitance
I.R.*
(Char. R [DC250V])
3
-> Post-treatment -> Capacitance
D.F. (Char. R [DC250V])
1
for 24±2 hrs. before initial measurements.
1
1
1
for 24±2 hrs. (Char. R [DC250V])
for 24±2 hrs. before initial measurements.
for 24±2 hrs.
Test Method
2
-> Post-treatment ->
D.F. ->
D.F. -> Life test ->
D.F.
C85E.pdf
1
.
08.10.29

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