ATF-55143-TR1G Avago Technologies US Inc., ATF-55143-TR1G Datasheet - Page 3

IC TRANS E-PHEMT 2GHZ SOT-343

ATF-55143-TR1G

Manufacturer Part Number
ATF-55143-TR1G
Description
IC TRANS E-PHEMT 2GHZ SOT-343
Manufacturer
Avago Technologies US Inc.
Datasheet

Specifications of ATF-55143-TR1G

Package / Case
SC-70-4, SC-82-4, SOT-323-4, SOT-343
Transistor Type
pHEMT FET
Frequency
2GHz
Gain
17.7dB
Voltage - Rated
5V
Current Rating
100mA
Noise Figure
0.6dB
Current - Test
10mA
Voltage - Test
2.7V
Power - Output
14.4dBm
Configuration
Single Dual Source
Transistor Polarity
N-Channel
Power Dissipation
270 mW
Drain Source Voltage Vds
5 V
Gate-source Breakdown Voltage
- 5 V to 1 V
Continuous Drain Current
100 mA
Maximum Operating Temperature
+ 150 C
Maximum Drain Gate Voltage
- 5 V to 1 V
Minimum Operating Temperature
- 65 C
Mounting Style
SMD/SMT
Continuous Drain Current Id
100mA
Power Dissipation Pd
270mW
Noise Figure Typ
0.6dB
No. Of Pins
4
Dc Current Gain Min (hfe)
17.7
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
516-1573-2

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
ATF-55143-TR1G
Manufacturer:
AVAGO
Quantity:
19 400
Part Number:
ATF-55143-TR1G
Manufacturer:
AVAGO
Quantity:
60 000
Part Number:
ATF-55143-TR1G
Manufacturer:
AGILENT
Quantity:
179
Part Number:
ATF-55143-TR1G
Manufacturer:
AVGO
Quantity:
20 000
Company:
Part Number:
ATF-55143-TR1G
Quantity:
30 000
ATF-55143 Electrical Specifications
T
Symbol
Vgs
Vth
Idss
Gm
Igss
NF
Ga
OIP3
P1dB
Notes:
1. Measurements obtained using production test board described in Figure 5.
2. Typical values determined from a sample size of 500 parts from 6 wafers.
Input
Figure 5. Block diagram of 2 GHz production test board used for Noise Figure, Associated Gain, P1dB, OIP3, and IIP3 measurements. This circuit represents a trade-off between
an optimal noise match, maximum OIP3 match and associated impedance matching circuit losses. Circuit losses have been de-embedded from actual measurements.
3
A
= 25°C, RF parameters measured in a test circuit for a typical device
Line Including
Transmission
(0.3 dB loss)
Parameter and Test Condition
Operational Gate Voltage
Threshold Voltage
Saturated Drain Current
Transconductance
Gate Leakage Current
Noise Figure
Associated Gain
Output 3
Intercept Point
1dB Compressed
Output Power
Gate Bias T
50 Ohm
rd
Order
[1]
[1]
[1]
[1]
Matching Circuit
Γ_mag = 0.4
Γ_ang = 83°
(0.3 dB loss)
f = 900 MHz
f = 900 MHz
f = 900 MHz
f = 900 MHz
f = 2 GHz
f = 2 GHz
f = 2 GHz
f = 2 GHz
Input
Vds = 2.7V, Ids = 10 mA
Vds = 2.7V, Ids = 2 mA
Vds = 2.7V, Vgs = 0V
Vds = 2.7V, gm = ∆Idss/∆Vgs;
∆Vgs = 0.75 – 0.7 = 0.05V
Vgd = Vgs = ‑2.7V
Vds = 2.7V, Ids = 10 mA
Vds = 2.7V, Ids = 10 mA
Vds = 2.7V, Ids = 10 mA
Vds = 2.7V, Ids = 10 mA
Vds = 2.7V, Ids = 10 mA
Vds = 2.7V, Ids = 10 mA
Vds = 2.7V, Ids = 10 mA
Vds = 2.7V, Ids = 10 mA
DUT
Matching Circuit
Γ_ang = -26°
Γ_mag = 0.5
(1.2 dB loss)
Output
Units
V
V
µA
mmho
µA
dB
dB
dB
dB
dBm
dBm
dBm
dBm
Min.
0.3
0.18
110
15.5
22.0
Line Including
Transmission
(0.3 dB loss)
Drain Bias T
50 Ohm
Typ.
0.47
0.37
0.1
220
0.6
0.3
17.7
21.6
24.2
22.3
14.4
14.2
[2]
Output
Max.
0.65
0.53
3
285
95
0.9
18.5

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