8200801LA E2V, 8200801LA Datasheet

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8200801LA

Manufacturer Part Number
8200801LA
Description
Manufacturer
E2V
Datasheet

Specifications of 8200801LA

Lead Free Status / RoHS Status
Supplier Unconfirmed
CURRENT CAGE CODE 67268
THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED
PMIC N/A
DSCC FORM 2233
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
THIS DRAWING IS AVAILABLE
DEPARTMENT OF DEFENSE
APR 97
AND AGENCIES OF THE
LTR
G
MICROCIRCUIT
H
K
F
J
L
FOR USE BY ALL
STANDARD
DEPARTMENTS
DRAWING
AMSC N/A
Change to vendor similar part number for vendor CAGE 18324.
Changes to table I parameters t
18324 to device types 03 and 04 as a source of supply. Add new
device design for device 04 for vendor CAGE 07933. Removed table
III, figure 5, and programming procedures. Editorial changes
throughout.
Changes in accordance with NOR 5962-R010-93
Changes in accordance with NOR 5962-R205-93
Updated boilerplate. Sheet 4, change V
mA to -1.6 mA; change C
C
20 pF; add footnote 3 to t
Remove vendors CAGE 50364 and 34335 as suppliers, and removed
their associated switching time test circuits.
Boilerplate update, part of 5 year review. ksr
Boilerplate update, part of 5 year review. ksr
OUT
max. limit for devices 01, 02, and 04 from 13 pF to
Darrell Hill
C. R. Jackson
N. A. Hauck
PREPARED BY
CHECKED BY
APPROVED BY
DRAWING APPROVAL DATE
REVISION LEVEL
REV
SHEET
DA
IN
DESCRIPTION
max. limit from 10 pF to 15 pF; change
test column. Removed logic diagrams.
82-09-01
EA
and C
L
L
1
OH
OUT
conditions from I
. Add vendor CAGE
L
2
REVISIONS
L
3
MICROCIRCUIT, MEMORY, DIGITAL,
SCHOTTKY BIPOLAR 32K PROGRAMMABLE
READ ONLY MEMORY (PROM), MONOLITHIC
SILICON
SHEET
L
4
SIZE
A
OH
5
L
= -2.0
L
6
COLUMBUS, OHIO 43218-3990
CAGE CODE
14933
DLA LAND AND MARITIME
91-10-30
93-02-12
93-08-10
97-05-29
05-06-30
10-11-10
http://www.dscc.dla.mil
DATE (YR-MO-DA)
L
7
1 OF
L
8
13
L
9
10
L
82008
M. A. Frye
M. A. Frye
M. A. Frye
Raymond Monnin
Raymond Monnin
Charles F. Saffle
11
L
5962-E069-11
APPROVED
12
L
13
L

Related parts for 8200801LA

8200801LA Summary of contents

Page 1

... OH OH max. limit from pF; change IN test column. Removed logic diagrams MICROCIRCUIT, MEMORY, DIGITAL, SCHOTTKY BIPOLAR 32K PROGRAMMABLE READ ONLY MEMORY (PROM), MONOLITHIC SILICON 82-09-01 SIZE L A SHEET DATE (YR-MO-DA) 91-10- Frye 93-02- Frye 93-08- Frye 97-05-29 = -2.0 Raymond Monnin 05-06-30 Raymond Monnin 10-11-10 Charles F ...

Page 2

... J Case outline (see 1.2.2) Circuit function 4096 words x 8 bits per word PROM, T.S. 4096 words x 8 bits per word PROM, T.S. 4096 words x 8 bits per word PROM, T.S. 4096 words x 8 bits per word PROM, T.S. Terminals ............................................ ...

Page 3

APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation ...

Page 4

Test Symbol High level output voltage Low level output voltage Input clamp voltage High impedance I V OHZ (Off-state) output high current High impedance I V OLZ (Off-state) output low current ...

Page 5

Device Types Case Outlines Terminal Number STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR Terminal Symbol ...

Page 6

Word number Notes Not applicable Input may be high level, low level, or open ...

Page 7

Notes: 1. Test table for devices programmed in accordance with an altered item drawing may be replaced by the equivalent tests which apply to the specific program configuration of the resulting read-only memory minimum, including ...

Page 8

FIGURE 3. Switching time test circuits and waveforms – Continued. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 Circuit F Continued SIZE A REVISION LEVEL 82008 SHEET L 8 ...

Page 9

Note 270 and R = 600 FIGURE 3. Switching time test circuits and waveforms – Continued. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 Circuit ...

Page 10

FIGURE 3. Switching time test circuits and waveforms – Continued. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 Circuit C Continued SIZE A REVISION LEVEL 82008 SHEET L 10 ...

Page 11

Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups ...

Page 12

MIL-STD-883 test requirements Interim electrical parameters (method 5004) Final electrical test parameters (method 5004) for unprogrammed devices Final electrical test parameters (method 5004) for programmed devices Group A test requirements (method 5005) Groups C and D end-point electrical parameters (method ...

Page 13

Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition The test circuit shall be ...

Page 14

... DLA Land and Maritime-VA. This information bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DLA Land and Maritime maintains an online database of all current sources of supply at http://www.dscc.dla.mil/Programs/Smcr/. Standard microcircuit drawing PIN 1/ 2/ 8200801JA 8200801KA 8200801LA 8200801XA 82008013A 8200802JA 8200802KA 8200802XA 82008023A See footnotes at end of listing. ...

Page 15

STANDARD MICROCIRCUIT DRAWING BULLETIN – Continued. Standard microcircuit drawing PIN 1/ 2/ number 8200803JA 8200803KA 82008033A 8200804JA 8200804KA 8200804LA 82008043A 1/ Military drawing and DSCC drawing PINs formerly had a programming procedure letter within the military drawing PIN: these parts ...

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