S29GL064A10TFIR43 Spansion Inc., S29GL064A10TFIR43 Datasheet - Page 3

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S29GL064A10TFIR43

Manufacturer Part Number
S29GL064A10TFIR43
Description
Manufacturer
Spansion Inc.
Datasheet

Specifications of S29GL064A10TFIR43

Cell Type
NOR
Density
64Mb
Access Time (max)
100ns
Interface Type
Parallel
Boot Type
Bottom
Address Bus
23/22Bit
Operating Supply Voltage (typ)
3/3.3V
Operating Temp Range
-40C to 85C
Package Type
TSOP
Sync/async
Asynchronous
Operating Temperature Classification
Industrial
Operating Supply Voltage (min)
3V
Operating Supply Voltage (max)
3.6V
Word Size
8/16Bit
Number Of Words
8M/4M
Supply Current
50mA
Mounting
Surface Mount
Pin Count
48
Lead Free Status / Rohs Status
Compliant
Distinctive Characteristics
This document states the current technical specifications regarding the Spansion product(s) described herein. Spansion Inc. deems the products to have been in sufficient pro-
duction volume such that subsequent versions of this document are not expected to change. However, typographical or specification corrections, or modifications to the valid com-
binations offered may occur.
This product family has been retired and is not recommended for designs. For new and current designs, the S29AL016J,
S29GL032N, and S29GL064N supersede S29GL016A ,S29GL032A, and S29GL064A respectively. These are the factory-
recommended migration paths. Please refer to the S29AL016J, S29GL032N, and S29GL064N data sheets for specifications
and ordering information. Availability of this document is retained for reference and historical purposes only.
Architectural Advantages
Performance Characteristics
S29GL-A MirrorBit
S29GL064A, S29GL032A, and S29GL016A
64 Megabit, 32 Megabit, and 16 Megabit
3.0-Volt only Page Mode Flash Memory
featuring 200 nm MirrorBit Process Technology
Data Sheet
Single power supply operation
– 3-Volt read, erase, and program operations
Manufactured on 200 nm MirrorBit process technology
Secured Silicon Sector region
– 128-word/256-byte sector for permanent, secure identification
– May be programmed and locked at the factory or by the customer
Flexible sector architecture
– 64Mb (uniform sector models): 128 32 Kword (64 KB) sectors
– 64 Mb (boot sector models): 127 32 Kword (64 KB) sectors
– 32 Mb (uniform sector models): 64 32Kword (64 KB) sectors
– 32 Mb (boot sector models): 63 32Kword (64 KB) sectors
– 16 Mb (boot sector models): 31 31Kword (64 KB) sectors
Compatibility with JEDEC standards
– Provides pinout and software compatibility for single-power supply
100,000 erase cycles typical per sector
20-year data retention typical
High performance
– 90 ns access time
– 4-word/8-byte page read buffer
– 25 ns page read times
– 16-word/32-byte write buffer which reduces overall programming
through an 8-word/16-byte random Electronic Serial Number,
accessible through a command sequence
+ 8 4Kword (8KB) boot sectors
+ 8 4Kword (8KB) boot sectors
+ 8 4Kword (8 KB) boot sectors
flash, and superior inadvertent write protection
time for multiple-word updates
Publication Number S29GL-A_00
®
Flash Family
Revision A
Software & Hardware Features
Amendment 12
Low power consumption
(typical values at 3.0 V, 5 MHz)
– 18 mA typical active read current
– 50 mA typical erase/program current
– 1 µA typical standby mode current
Package options
– 48-pin TSOP
– 56-pin TSOP
– 64-ball Fortified BGA
– 48-ball fine-pitch BGA
– 56-ball fine pitch BGA
Software features
– Program Suspend & Resume: read other sectors before
– Erase Suspend & Resume: read/program other sectors before an
– Data# polling & toggle bits provide status
– CFI (Common Flash Interface) compliant: allows host system to
– Unlock Bypass Program command reduces overall multiple-word
Hardware features
– Sector Group Protection: hardware-level method of preventing write
– Temporary Sector Unprotect: V
– WP#/ACC input accelerates programming time (when high voltage
– Hardware reset input (RESET#) resets device
– Ready/Busy# output (RY/BY#) detects program or erase cycle
(MCP-compatible for cellular handsets)
programming operation is completed
erase operation is completed
identify and accommodate multiple flash devices
programming time
operations within a sector group
locked sectors
is applied) for greater throughput during system production. Protects
first or last sector regardless of sector protection settings on uniform
sector models
completion
Issue Date May 21, 2008
ID
-level method of charging code in

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