MAX1555EZK Maxim, MAX1555EZK Datasheet - Page 4

• Manufacturer Part Number: MAX1555EZK
• Description: PLASTIC ENCAPSULATED DEVICES
• Manufacturer: Maxim

V. Quality Assurance Information
VI. Reliability Evaluation
A. Quality Assurance Contacts: Jim Pedicord
B. Outgoing Inspection Level:
C. Observed Outgoing Defect Rate: < 50 ppm
D. Sampling Plan: Mil-Std-105D
A. Accelerated Life Test
Rate ( ) is calculated as follows:
Maxim also performs weekly Burn-In on samples from production to assure reliability of its processes.
reliability required for lots which receive a burn-in qualification is 59 F.I.T. at a 60% confidence level, which equates
to 3 failures in an 80 piece sample. Maxim performs failure analysis on rejects from lots exceeding this level. The
Burn-In Schematic (Spec.# 06-6146) shows the static circuit used for this test. Maxim also performs 1000 hour life
test monitors quarterly for each process. This data is published in the Product Reliability Report (RR-1M) located
on the Maxim website at http://www.maxim-ic.com .
B. Moisture Resistance Tests
Pressure Pot testing must pass a 20% LTPD for acceptance. Additionally, industry standard 85 C/85%RH or
HAST tests are performed quarterly per device/package family.
B. E.S.D. and Latch-Up
883 Method 3015 (reference attached ESD Test Circuit). Latch-Up testing has shown that this device withstands a
current of 250mA.
=
= 22.62 x 10
MTTF
1
The results of the 135 C biased (static) life test are shown in Table 1. Using these results, the Failure
This low failure rate represents data collected from Maxim’s reliability qualification and monitor programs.
Maxim evaluates pressure pot stress from every assembly process during qualification of each new design.
PN20-1 die type has been found to have all pins able to withstand a transient pulse of 1000V, per Mil-Std-
=
-9
192 x 4389 x 48 x 2
1.83
= 22.62 F.I.T. (60% confidence level @ 25 C)
Temperature Acceleration factor assuming an activation energy of 0.8eV
0.1% for all electrical parameters guaranteed by the Datasheet.
0.1% For all Visual Defects.
Bryan Preeshl
Kenneth Huening (Vice President)
(Chi square value for MTTF upper limit)
(Manager, Reliability Operations)
(Executive Director of QA)
The