MX29F200CT Macronix International, MX29F200CT Datasheet - Page 23

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MX29F200CT

Manufacturer Part Number
MX29F200CT
Description
2M-BIT [256Kx8/128Kx16] CMOS FLASH MEMORY
Manufacturer
Macronix International
Datasheet
SWITCHING TEST CIRCUITS
SWITCHING TEST WAVEFORMS for 29F200C T/B-70 and 29F200C T/B-90
SWITCHING TEST WAVEFORMS for 29F200C T/B-55
P/N:PM1250
0.7xVCC
0.45V
3.0V
0V
DEVICE UNDER
AC TESTING: Inputs are driven at 3.0V for a logic "1" and 0V for a logic "0".
Input pulse rise and fall times are < 5ns.
AC TESTING: Inputs are driven at 0.7xVCC for a logic "1" and 0.45V for a logic "0".
Input pulse rise and fall times are < 10ns.
TEST
INPUT
INPUT
CL=30pF Including jig capacitance for 55ns
CL=100pF Including jig capacitance for 70ns and 90ns
1.5V
2.0V
0.8V
CL
TEST POINTS
TEST POINTS
23
6.2K ohm
MX29F200C T/B
1.5V
0.8V
2.0V
OR EQUIVALENT
DIODES=IN3064
2.7K ohm
OUTPUT
OUTPUT
+5V
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REV. 1.0 , DEC. 14, 2005

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