adc14071eval National Semiconductor Corporation, adc14071eval Datasheet - Page 10

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adc14071eval

Manufacturer Part Number
adc14071eval
Description
14-bit, 7 Msps, 380 Mw A/d Converter
Manufacturer
National Semiconductor Corporation
Datasheet
www.national.com
Typical Performance Characteristics
otherwise stated. (Continued)
SINAD & ENOB vs Temp
SFDR vs Temperature
IMD Response
Specification Definitions
APERTURE JITTER is the variation in aperture delay from
sample to sample. Aperture jitter shows up as input noise.
APERTURE DELAY is the time from the sampling edge of
the clock to when the input signal is acquired or held for con-
version. In other words, it is the time required for the Sample/
Hold circuit to go from the sample mode to the hold
DS101101-19
DS101101-21
DS101101-17
V
SINAD & ENOB vs Clock Duty Cycle
Power Consumption vs f
Spectral Response
10
A
= V
mode. The Sample/Hold circuit effectively stops capturing
the input signal and goes into the hold mode this amount of
time after the clock transition.
DIFFERENTIAL NON-LINEARITY (DNL) is the measure of
the maximum deviation from the ideal step size of 1 LSB.
EFFECTIVE NUMBER OF BITS (ENOB, or EFFECTIVE
BITS) is another method of specifying Signal-to-Noise and
D
= DR V
D
= 5V. f
CLK
CLK
= 7MHz, f
IN
DS101101-20
DS101101-22
= 500KHz unless
DS101101-18

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