le79234-sw Zarlink Semiconductor, le79234-sw Datasheet - Page 20

• Manufacturer Part Number: le79234-sw
• Description: Voiceedgetm Control Processor Software Package Next Generation Carrier Chipset Ngcc
• Manufacturer: Zarlink Semiconductor

Notes:
1.
2.
Hazardous potential test AC
Foreign voltage test AC
Hazardous potential test DC
Foreign voltage test DC
Resistive fault test
Receiver off-hook test
Ringer test
GR-909 tests
DC feed test
Ringing test
Two-wire channel loss
Echo return loss
Idle channel noise
Inward equipment testing
Requires the test load resistor as the termination.
Using open-circuit as the reflect termination.
Outward loop testing
GR-909 test names
1
1
1
1, 2
Table 8 - GR-909 Tests and their corresponding Test Library Names
To measure the foreign AC Voltage present in the loop. A high pass filter is
used to filter out any DC voltage present on the line.
To measure the foreign DC Voltage present in the loop while the card is in a
high impedance state
To measure any resistive fault present between Tip and Ground, Ring and
Ground, Tip and Ring.
To verify the difference between a receiver taken off-hook and a line short.
To measure the ringer equivalence number of a phone
Performs all outward loop tests
See DC Feed and On-OFF Hook Self Test definitions in
To verify the capability of the line card circuitry to generate a ringing voltage at
the desired amplitude and to perform ring trip upon an off-hook event
To measure the Trans Hybrid Loss of the line circuit under test
To measure the sum of the line circuit noise and the subscriber loop noise
using a C-Message filter
Description
Le79234-SW
Zarlink Semiconductor Inc.
Table 7
20
VPTL_TID_OPEN_AC_VOLTAGE
VPTL_TID_OPEN_DC_VOLTAGE
VPTL_TID_3ELE_RES
VPTL_TID_ROH
VPTL_TID_REN
VPTL_TID_GR909_ALL
VPTL_TID_DC_FEED_SELF_TEST and
VPTL_TID_ON_OFF_HOOK_SELF_TEST
VPTL_TID_RINGING_SELF_TEST
VPTL_TID_TRANSMISSION_SELF_TEST or
VPTL_TID_TRANS_HYBRID_LOSS
VPTL_TID_NOISE
Test library function
Data Sheet