glt4160l04se-70tc G-Link Technology Corporation, glt4160l04se-70tc Datasheet - Page 18

• Manufacturer Part Number: glt4160l04se-70tc
• Description: 4m X 4 Cmos Dynamic Ram With Extended Data Output
• Manufacturer: G-Link Technology Corporation

TEST MODE IN CYCLE
Test Mode
(1) Setting the mode
(2) Write / read operation
(3) Refresh
(4) Mode Cancellation
By using the test mode, the test time can be reduced. The reason for this is that, the memory emulates the x 16-
bit organization during test mode. Don’t care about the input levels of the CAS input A0, A1 .
Executing the test mode cycle (WE , CAS before RAS refresh cycle ) sets the test mode.
When either a “0” or a “1” is written to the input pin in test mode, this data is written to 16 bits of memory cell.
Next, when the data is read from the output pin at the same address, the cell be checked.
Refresh in the test mode must be performed with the RAS / CAS cycle or with the WE, CAS before RAS refresh
cycle. The WE, CAS before RAS refresh cycle use the same counter as the CAS before RAS refresh’s internal
counter.
The test mode is cancelled by executing one cycle of RAS only refresh cycle or CAS before RAS refresh cycle.
G-LINK
Output = “1” Normal write (all memory cells)
Output = “0” Abnormal write
RAS
CAS
WE
DQ
V
V
I/OH-
I/OL-
V
V
V
V
V
V
IH-
IL-
IH-
IL-
IH-
IL-
t
t
CP
RPC
t
Web : www.glink.com.tw
t
RP
WTS
t
t
CSR
CEZ
G-Link Technology Corporation,Taiwan
4M X 4 CMOS DYNAMIC RAM WITH EXTENDED DATA OUTPUT
t
WTH
TEL : [phone]
t
CHR
- 18 -
Email : [e-mail]
t
RAS
t
RC
OPEN
Don't Care
t
RPC
t
RP
GLT4160L04
SEPT 2004 (Rev.4.3)