CY7C1381C-100AC Cypress Semiconductor Corp, CY7C1381C-100AC Datasheet - Page 28

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CY7C1381C-100AC

Manufacturer Part Number
CY7C1381C-100AC
Description
IC SRAM 18MBIT 100MHZ 100LQFP
Manufacturer
Cypress Semiconductor Corp
Datasheet

Specifications of CY7C1381C-100AC

Format - Memory
RAM
Memory Type
SRAM - Synchronous
Memory Size
18M (512K x 36)
Speed
100MHz
Interface
Parallel
Voltage - Supply
3.135 V ~ 3.6 V
Operating Temperature
0°C ~ 70°C
Package / Case
100-LQFP
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
CY7C1381C-100AC
Quantity:
20
Part Number:
CY7C1381C-100AC
Manufacturer:
Cypress Semiconductor Corp
Quantity:
10 000
Document #: 38-05238 Rev. *B
Switching Characteristics
t
Clock
t
t
t
Output Times
t
t
t
t
t
t
t
Setup Times
t
t
t
t
t
t
Hold Times
t
t
t
t
t
t
Notes:
15. This part has a voltage regulator internally; t
16. t
17. At any given voltage and temperature, t
18. This parameter is sampled and not 100% tested.
19. Timing reference level is 1.5V when V
20. Test conditions shown in (a) of AC Test Loads unless otherwise noted.
POWER
CYC
CH
CL
CDV
DOH
CLZ
CHZ
OEV
OELZ
OEHZ
AS
ADS
ADVS
WES
DS
CES
AH
ADH
WEH
ADVH
DH
CEH
Parameter
can be initiated.
data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed
to achieve High-Z prior to Low-Z under the same system conditions
CHZ
, t
CLZ
,t
OELZ
, and t
V
Clock Cycle Time
Clock HIGH
Clock LOW
Data Output Valid After CLK Rise
Data Output Hold After CLK Rise
Clock to Low-Z
Clock to High-Z
OE LOW to Output Valid
OE LOW to Output Low-Z
OE HIGH to Output High-Z
Address Set-up Before CLK Rise
ADSP, ADSC Set-up Before CLK Rise
ADV Set-up Before CLK Rise
GW, BWE, BW
Rise
Data Input Set-up Before CLK Rise
Chip Enable Set-up
Address Hold After CLK Rise
ADSP, ADSC Hold After CLK Rise
GW , BWE , BW
ADV Hold After CLK Rise
Data Input Hold After CLK Rise
Chip Enable Hold After CLK Rise
OEHZ
DD
(Typical) to the first Access
are specified with AC test conditions shown in part (b) of AC Test Loads. Transition is measured ± 200 mV from steady-state voltage.
DDQ
Description
[A:D]
[16, 17, 18]
[A:D]
OEHZ
Over the Operating Range
[16, 17, 18]
= 3.3V and is 1.25V when V
POWER
Hold After CLK Rise
is less than t
Set-up Before CLK
is the time that the power needs to be supplied above V
[16, 17, 18]
[16, 17, 18]
OELZ
[15]
and t
CHZ
DDQ
is less than t
[19, 20]
= 2.5V.
Min.
7.5
2.1
2.1
2.0
2.0
1.5
1.5
1.5
1.5
1.5
1.5
0.5
0.5
0.5
0.5
0.5
0.5
1
0
0
133 MHz
CLZ
Max.
6.5
4.0
3.2
4.0
to eliminate bus contention between SRAMs when sharing the same
Min.
8.5
2.3
2.3
2.0
2.0
1.5
1.5
1.5
1.5
1.5
1.5
0.5
0.5
0.5
0.5
0.5
0.5
1
0
0
117 MHz
DD
( minimum) initially, before a read or write operation
Max.
7.5
4.0
3.4
4.0
Min.
2.5
2.5
2.0
2.0
1.5
1.5
1.5
1.5
1.5
1.5
0.5
0.5
0.5
0.5
0.5
0.5
10
1
0
0
100 MHz
CY7C1381C
CY7C1383C
Max.
8.5
5.0
3.8
5.0
Page 28 of 36
Unit
ms
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
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ns
ns
ns
ns

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